Sequential circuit test generation using dynamic state traversal

Proceedings of European Design and Test Conference

Volumn , Issue , 1997, Pages 22-28

  Hsiao, Michael S ^a   Rudnick, Elizabeth M ^a   Patel, Janak H ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; GENETIC ALGORITHMS; INTEGRATED CIRCUIT TESTING; STATE ASSIGNMENT; TRANSFER FUNCTIONS; VECTORS;

STATE TRANSFER SEQUENCES;

SEQUENTIAL CIRCUITS;

EID: 0030652729     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)