Study in coverage-driven test generation

Proceedings - Design Automation Conference

Volumn , Issue , 1999, Pages 970-975

  Benjamin, Mike ^a   Geist, Daniel ^a   Hartman, Alan ^a   Wolfsthal, Yaron ^a   Mas, Gerard ^a   Smeets, Ralph ^a  

^a STMicroelectronics Ltd Bristol   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MICROPROCESSOR CHIPS;

SOFTWARE PACKAGE GOTCHA;

COMPUTER TESTING;

EID: 0032667939     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)