Efficient Sequential ATPG Based on Partitioned Finite-State-Machine Traversal

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 281-289

  Wu, Qingwei ^a   Hsiao, Michael S ^a  

^a State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; COMPUTER SIMULATION; FLIP FLOP CIRCUITS; SPECTRUM ANALYSIS;

PATTERN GENERATION;

SEQUENTIAL CIRCUITS;

EID: 0142184816     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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