-
2
-
-
0019009364
-
Towards analyzing and synthesizing protocols
-
April
-
P. Zafiropulo, C. H. West, H. Rudin, D. D. Cowan and D. Brand, "Towards analyzing and synthesizing protocols," IEEE Trans. Comm., 28(4), April 1980.
-
(1980)
IEEE Trans. Comm.
, vol.28
, Issue.4
-
-
Zafiropulo, P.1
West, C.H.2
Rudin, H.3
Cowan, D.D.4
Brand, D.5
-
3
-
-
0034477916
-
Simulation coverage enhancement using test stimulus transformation
-
C. N. Ip, "Simulation Coverage Enhancement Using Test Stimulus Transformation," Proc. Int'l Conf. CAD, 2000.
-
(2000)
Proc. Int'l Conf. CAD
-
-
Ip, C.N.1
-
5
-
-
0004602740
-
Coverage-directed test generation using symbolic techniques
-
D. Geist, M. Farkas, A. Landver, Y. Lichtenstein, S. Ur and Y. Wolfsthal, "Coverage-directed test generation using symbolic techniques," M. Conf. CAD, 1996.
-
(1996)
M. Conf. CAD
-
-
Geist, D.1
Farkas, M.2
Landver, A.3
Lichtenstein, Y.4
Ur, S.5
Wolfsthal, Y.6
-
6
-
-
0032667939
-
A study in coverage-driven test generation
-
M. Benjamin, D. Geist, A. Hartman, Y. Wolfethal, G. Mas and R. Smeets, "A study in coverage-driven test generation," Prof. DAC, 1999.
-
(1999)
Prof. DAC
-
-
Benjamin, M.1
Geist, D.2
Hartman, A.3
Wolfethal, Y.4
Mas, G.5
Smeets, R.6
-
7
-
-
0031697677
-
Abstraction techniques for validation coverage analysis and test generation
-
D. Moundanos, J. A. Abraham and Y. V. Hoskote, "Abstraction techniques for validation coverage analysis and test generation," IEEE Trans. Computers, 47(1):2-14, 1998.
-
(1998)
IEEE Trans. Computers
, vol.47
, Issue.1
, pp. 2-14
-
-
Moundanos, D.1
Abraham, J.A.2
Hoskote, Y.V.3
-
8
-
-
0036734173
-
Efficient sequential test generation based on logic simulation
-
S. Sheng and M. S. Hsiao, "Efficient Sequential Test Generation Based on Logic Simulation", IEEE Design & Test of Computers, vol. 19, no. 5, pp. 56-64, 2002
-
(2002)
IEEE Design & Test of Computers
, vol.19
, Issue.5
, pp. 56-64
-
-
Sheng, S.1
Hsiao, M.S.2
-
9
-
-
0142184816
-
Efficient sequential ATPG based on partitioned finite-state-machine traversal
-
Q. Wu and M. S. Hsiao, "Efficient Sequential ATPG Based on Partitioned Finite-State-Machine Traversal", Proc. Intl Test Conf., 2003, pp. 281-289.
-
(2003)
Proc. Intl Test Conf.
, pp. 281-289
-
-
Wu, Q.1
Hsiao, M.S.2
-
10
-
-
84893657842
-
Efficient spectral techniques for sequential ATPG
-
A. Giani et al., "Efficient Spectral Techniques for Sequential ATPG," Proc. Design Aut. & Test in Europe Conf., 2001, pp. 204-208.
-
(2001)
Proc. Design Aut. & Test in Europe Conf.
, pp. 204-208
-
-
Giani, A.1
-
11
-
-
0024913805
-
Combinational profiles of sequential benchmark circuits
-
F. Brglez, D. Bryan, and K. Kozminski, "Combinational profiles of sequential benchmark circuits," Int. Symp. Circuits & Systems, 1989, pp. 1929-1934.
-
(1989)
Int. Symp. Circuits & Systems
, pp. 1929-1934
-
-
Brglez, F.1
Bryan, D.2
Kozminski, K.3
-
12
-
-
0003382839
-
ITC99 benchmark circuits- preliminary results
-
S. Davidson and Panelists, "ITC99 benchmark circuits- preliminary results," Proc. Int'l Test Conf., 1999, pp. 1125.
-
(1999)
Proc. Int'l Test Conf.
, pp. 1125
-
-
Davidson, S.1
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