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Volumn , Issue , 2004, Pages 389-394

Efficient ATPG for design validation based on partitioned state exploration histories

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN VALIDATION; SPECTRAL INFORMATION; STATE GROUPS; STATE PARTITIONING;

EID: 3142683888     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (12)
  • 3
    • 0034477916 scopus 로고    scopus 로고
    • Simulation coverage enhancement using test stimulus transformation
    • C. N. Ip, "Simulation Coverage Enhancement Using Test Stimulus Transformation," Proc. Int'l Conf. CAD, 2000.
    • (2000) Proc. Int'l Conf. CAD
    • Ip, C.N.1
  • 7
    • 0031697677 scopus 로고    scopus 로고
    • Abstraction techniques for validation coverage analysis and test generation
    • D. Moundanos, J. A. Abraham and Y. V. Hoskote, "Abstraction techniques for validation coverage analysis and test generation," IEEE Trans. Computers, 47(1):2-14, 1998.
    • (1998) IEEE Trans. Computers , vol.47 , Issue.1 , pp. 2-14
    • Moundanos, D.1    Abraham, J.A.2    Hoskote, Y.V.3
  • 8
    • 0036734173 scopus 로고    scopus 로고
    • Efficient sequential test generation based on logic simulation
    • S. Sheng and M. S. Hsiao, "Efficient Sequential Test Generation Based on Logic Simulation", IEEE Design & Test of Computers, vol. 19, no. 5, pp. 56-64, 2002
    • (2002) IEEE Design & Test of Computers , vol.19 , Issue.5 , pp. 56-64
    • Sheng, S.1    Hsiao, M.S.2
  • 9
    • 0142184816 scopus 로고    scopus 로고
    • Efficient sequential ATPG based on partitioned finite-state-machine traversal
    • Q. Wu and M. S. Hsiao, "Efficient Sequential ATPG Based on Partitioned Finite-State-Machine Traversal", Proc. Intl Test Conf., 2003, pp. 281-289.
    • (2003) Proc. Intl Test Conf. , pp. 281-289
    • Wu, Q.1    Hsiao, M.S.2
  • 10
    • 84893657842 scopus 로고    scopus 로고
    • Efficient spectral techniques for sequential ATPG
    • A. Giani et al., "Efficient Spectral Techniques for Sequential ATPG," Proc. Design Aut. & Test in Europe Conf., 2001, pp. 204-208.
    • (2001) Proc. Design Aut. & Test in Europe Conf. , pp. 204-208
    • Giani, A.1
  • 12
    • 0003382839 scopus 로고    scopus 로고
    • ITC99 benchmark circuits- preliminary results
    • S. Davidson and Panelists, "ITC99 benchmark circuits- preliminary results," Proc. Int'l Test Conf., 1999, pp. 1125.
    • (1999) Proc. Int'l Test Conf. , pp. 1125
    • Davidson, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.