Efficient spectral techniques for sequential ATPG

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2001, Pages 204-208

  Giani, Ashish ^a   Sheng, Shuo ^a   Hsiao, Michael S ^a   Agrawal, Vzshwani D ^b  

^a RUTGERS UNIVERSITY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARK CIRCUIT; FAULT COVERAGES; FREQUENCY DOMAINS; ITERATIVE PROCESS; SEQUENTIAL ATPG; SPECTRAL INFORMATION; SPECTRAL TECHNIQUES; TEST GENERATION PROCEDURE;

EXHIBITIONS; ITERATIVE METHODS; SPECTRUM ANALYSIS;

INFORMATION FILTERING;

EID: 84893657842     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2001.915025     Document Type: Conference Paper

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