Timing-independent testing of crosstalk in the presence of delay producing defects using surrogate fault models

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 1024-1033

  Irajpour, Shahdad ^a   Gupta, Sandeep K ^a   Breuer, Melvin A ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITIVE CROSSTALK; DELAY PRODUCING DEFECTS; FAULT MODELS; TIMING-INDEPENDENT TESTING;

COMBINATORIAL CIRCUITS; COMPUTER AIDED DESIGN; DELAY CIRCUITS; INTEGRATED CIRCUIT TESTING; LARGE SCALE SYSTEMS; MATHEMATICAL MODELS;

CROSSTALK;

EID: 18144366629     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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