Test generation for crosstalk-induced faults: Framework and computational results

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 18, Issue 1, 2002, Pages 17-28

  Chen, Wei Yu ^a   Gupta, Sandeep K ^b   Breuer, Melvin A ^b  

^a SUN MICROSYSTEMS   (United States)

^b University of Southern California   (United States)

Author keywords

Crosstalk; Fault modeling; Mixed signal test; Time based test generation

Indexed keywords

ALGORITHMS; COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; CROSSTALK; DIGITAL INTEGRATED CIRCUITS; ERRORS; VECTORS;

CROSSTALK-INDUCED FAULTS; LOGIC ERROR; SOFTWARE PACKAGE SPICE; SOFTWARE PACKAGE XGEN; TWO-VECTOR TESTS;

INTEGRATED CIRCUIT TESTING;

EID: 0036471001     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1013771821826     Document Type: Article

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