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Volumn 353-356, Issue , 2001, Pages 807-814

III-nitride power devices - good results and great expectations

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON GAS; HETEROJUNCTIONS; HIGH ELECTRON MOBILITY TRANSISTORS; INTERFACES (MATERIALS); MICROWAVE DEVICES; MOSFET DEVICES; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR QUANTUM WELLS; SILICON CARBIDE; STRAIN;

EID: 14344275374     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4028/www.scientific.net/msf.353-356.807     Document Type: Article
Times cited : (12)

References (19)
  • 5
    • 0002735247 scopus 로고    scopus 로고
    • GaN and AlGaN Devices: Field Effect Transistors and Photodetectors, Gordon and Breach Science Publishers, Series Optoelectronic Properties of Semiconductors and Superlattices
    • S. Pearton, Editor
    • M. S. Shur and M. A. Khan, GaN and AlGaN Devices: Field Effect Transistors and Photodetectors, Gordon and Breach Science Publishers, Series Optoelectronic Properties of Semiconductors and Superlattices, Vol. 7 GaN and Related Materials II, pp. 47-86, S. Pearton, Editor (1999)
    • (1999) GaN and Related Materials II , vol.7 , pp. 47-86
    • Shur, M.S.1    Khan, M.A.2
  • 7
    • 84889165490 scopus 로고    scopus 로고
    • Gordon & Breach Science Publishers, O. Manasreh an Ed Yu, Editors, to be published
    • R. Gaska, M. S. Shur, and A. Khan, GaN-based HEMTs, Gordon & Breach Science Publishers, O. Manasreh an Ed Yu, Editors, to be published
    • GaN-based HEMTs
    • Gaska, R.1    Shur, M.S.2    Khan, A.3
  • 8
    • 0001323827 scopus 로고    scopus 로고
    • Temperature dependence of impact ionization in AlGaN-GaN Heterostructure Field Effect Transistors
    • N. V. Dyakonova, A. Dickens, M. S. Shur, R. Gaska, J. W. Yang, Temperature dependence of impact ionization in AlGaN-GaN Heterostructure Field Effect Transistors, Applied Physics Letters. 72 (1998) p. 2562
    • (1998) Applied Physics Letters , vol.72 , pp. 2562
    • Dyakonova, N.V.1    Dickens, A.2    Shur, M.S.3    Gaska, R.4    Yang, J.W.5
  • 9
    • 0032139629 scopus 로고    scopus 로고
    • Impact ionization in AlGaN-GaN Heterostructure Field Effect Transistors on Sapphire Substrates
    • N. V. Dyakonova, A. Dickens, M. S. Shur, R. Gaska, J. W. Yang, Impact ionization in AlGaN-GaN Heterostructure Field Effect Transistors on Sapphire Substrates, Electronics Letters. 34 (1998) p. 1699
    • (1998) Electronics Letters , vol.34 , pp. 1699
    • Dyakonova, N.V.1    Dickens, A.2    Shur, M.S.3    Gaska, R.4    Yang, J.W.5
  • 14
    • 0001348454 scopus 로고    scopus 로고
    • Hans zur Loye, G. Tamulaitis, A. Zukauskas, D. Smith, and R. Bicknell-Tassius
    • M. A. Khan, J. W. Yang, G. Simin, R. Gaska and M. S. Shur, Hans zur Loye, G. Tamulaitis, A. Zukauskas, D. Smith, and R. Bicknell-Tassius, Appl. Phys. Lett. 76 (2000) p. 1161
    • (2000) Appl. Phys. Lett. , vol.76 , pp. 1161
    • Khan, M.A.1    Yang, J.W.2    Simin, G.3    Gaska, R.4    Shur, M.S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.