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Volumn 47, Issue 4, 2000, Pages 692-696

High voltage GaN Schottky rectifiers

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE CURRENTS; POWER ELECTRONICS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0033879748     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.830981     Document Type: Article
Times cited : (85)

References (21)
  • 13
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    • Electron Devices
    • Weitzel, C.E.1
  • 15
    • 0000110525 scopus 로고    scopus 로고
    • High voltage (450V) GaN Schottky rectifiers, Appl
    • vol. 74, p. 1266, 1999.
    • Z. Z. Bandic et al., High voltage (450V) GaN Schottky rectifiers, Appl. Phys. Lett., vol. 74, p. 1266, 1999.
    • Phys. Lett.
    • Bandic, Z.Z.1
  • 17
    • 0032613608 scopus 로고    scopus 로고
    • Depth and thermal stability of dry etch damage in GaN, Appl
    • vol. 75, p. 232, 1999.
    • X. A. Cao et al., Depth and thermal stability of dry etch damage in GaN, Appl. Phys. Lett., vol. 75, p. 232, 1999.
    • Phys. Lett.
    • Cao, X.A.1
  • 18
    • 0031640929 scopus 로고    scopus 로고
    • + p junction rectifiers, in Int. Symp. Power Semiconductor Devices and ICs 1998, Kyoto, Japan, 1998, pp. 387-390.
    • + p junction rectifiers, in Int. Symp. Power Semiconductor Devices and ICs 1998, Kyoto, Japan, 1998, pp. 387-390.
    • Phosphorus-implanted High-voltage
    • Patel, R.1    Ai, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.