Ordering parameters of self-organized three-dimensional quantum-dot lattices determined from anomalous x-ray diffraction

Applied Physics Letters

Volumn 84, Issue 6, 2004, Pages 885-887

  Lechner, R T ^a   Schulli T U ^a,c   Holy V ^a,d   Springholz, G ^a   Stangl, J ^a   Raab, A ^a   Bauer, G ^a   Metzger, T H ^b  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c CEA GRENOBLE   (France)

^d MASARYK UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; MATHEMATICAL MODELS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR SUPERLATTICES; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

LAYER SPACINGS; QUANTUM DOT LATTICES; THEORETICAL DOT ORDERING MODEL;

SEMICONDUCTOR QUANTUM DOTS;

EID: 10744227366     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1644627     Document Type: Article

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