메뉴 건너뛰기




Volumn 79, Issue 13, 2001, Pages 1971-1973

Structure and ordering of GaN quantum dot multilayers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035943870     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1403657     Document Type: Article
Times cited : (30)

References (15)
  • 5
    • 0003293990 scopus 로고
    • Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutrons Scattering
    • Springer, Berlin
    • H. Dosch, Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutrons Scattering, Springer Tracts in Modern Physics Vol. 126 (Springer, Berlin, 1992).
    • (1992) Springer Tracts in Modern Physics , vol.126
    • Dosch, H.1
  • 6
    • 0003314824 scopus 로고    scopus 로고
    • High Resolution X-ray Scattering from Thin Films and Multilayers
    • Springer Berlin
    • V. Holý, U. Pietsch, and T. Baumbach, High Resolution X-ray Scattering from Thin Films and Multilayers, Springer Tracts in Modern Physics Vol. 149 (Springer Berlin, 1999).
    • (1999) Springer Tracts in Modern Physics , vol.149
    • Holý, V.1    Pietsch, U.2    Baumbach, T.3
  • 7
    • 0003265912 scopus 로고    scopus 로고
    • X-ray Scattering from Soft-Matter Thin Films
    • Springer, Berlin
    • M. Tolan, X-ray Scattering from Soft-Matter Thin Films, Springer Tracts in Modern Physics Vol. 148 (Springer, Berlin, 1999).
    • (1999) Springer Tracts in Modern Physics , vol.148
    • Tolan, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.