Strain determination in multilayers by complementary anomalous x-ray diffraction

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 19, 2004, Pages

  Schulli T U ^a,b   Lechner, R T ^a   Stangl, J ^a   Springholz, G ^a   Bauer, G ^a   Sztucki, M ^b   Metzger, T H ^b  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EUROPIUM; LEAD; SELENIUM; TELLURIUM;

ABSORPTION; ARTICLE; CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; DIFFUSION COEFFICIENT; ENERGY; MATHEMATICAL ANALYSIS; MOLECULAR MECHANICS; STRAIN IDENTIFICATION; X RAY DIFFRACTION;

EID: 42749104995     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.195307     Document Type: Article

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