Height dependence of image contrast when imaging by non-contact AFM

Surface Science

Volumn 464, Issue 2-3, 2000, Pages

  Sokolov, I Yu ^a   Henderson, G S ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; IMAGE QUALITY; SURFACE ROUGHNESS; SURFACE STRUCTURE;

HEIGHT DEPENDENCE; IMAGE CONTRAST; SURFACE DEFECTS;

ATOMIC FORCE MICROSCOPY;

EID: 0034290951     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00735-4     Document Type: Article

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