Discontinuous molecular films can control metal/semiconductor junctions

Advanced Materials

Volumn 16, Issue 23-24, 2004, Pages 2145-2151

  Haick, Hossam ^a   Ambrico, Marianna ^b   Ligonzo, Teresa ^c   Cahen, David ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b CNR   (Italy)

^c UNIVERSITY OF BARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINDING ENERGY; ELECTRIC POTENTIAL; ELECTRODES; ELECTROSTATICS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; METALS; MOLECULES; MONOLAYERS; OPTOELECTRONIC DEVICES; PHOTOEMISSION; SEMICONDUCTOR JUNCTIONS; SPECTROSCOPIC ANALYSIS; TRANSPORT PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

CONDUCTION BAND (CB); HYBRID DEVICES; INTERNAL PHOTOEMISSION (IPE); MOLECULAR FILMS; SCANNING PROBE MICROSCOPY (SPM);

THIN FILMS;

EID: 11344290288     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200400923     Document Type: Article

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