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Volumn 495, Issue 2, 2001, Pages 98-105

Characterization of defects in the formation process of self-assembled thiol monolayers by electrochemical impedance spectroscopy

Author keywords

A.c. impedance; Defect; Fractional coverage; Octadecanethiol; Self assembled monolayer

Indexed keywords

ADSORPTION; DEFECTS; ELECTRIC IMPEDANCE; ELECTRODEPOSITION; GOLD; MONOLAYERS; SPECTROSCOPY; SULFUR COMPOUNDS;

EID: 0035808157     PISSN: 00220728     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(00)00424-1     Document Type: Article
Times cited : (100)

References (58)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.