-
2
-
-
0034735798
-
-
Joachim, C.; Gimzewski, J. K.; Aviram, A. Nature 2000, 408, 541.
-
(2000)
Nature
, vol.408
, pp. 541
-
-
Joachim, C.1
Gimzewski, J.K.2
Aviram, A.3
-
4
-
-
0002743046
-
Langmuir-Blodgett films
-
Petty, M. C., Bryce, M. R., Bloor, D., Eds.; Edward Arnold: London; Chapter 10
-
Richardson, T. Langmuir-Blodgett films. In An Introduction to Molecular Electronics, 1st ed.; Petty, M. C., Bryce, M. R., Bloor, D., Eds.; Edward Arnold: London, 1995; Chapter 10, p 220.
-
(1995)
An Introduction to Molecular Electronics, 1st Ed.
, pp. 220
-
-
Richardson, T.1
-
12
-
-
0033546682
-
-
Slowinski, K.; Fong, H. K. Y.; Majda, M. J. Am. Chem. Soc. 1999, 121, 7257.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, pp. 7257
-
-
Slowinski, K.1
Fong, H.K.Y.2
Majda, M.3
-
13
-
-
0035907729
-
-
Holmlin, R. E.; Ismagilov, R. F.; Haag, R.; Mujica, V.; Ratner, M. A.; Rampi, M. A.; Whitesides, G. M. Angew. Chem., Int. Ed. 2001, 40, 2316.
-
(2001)
Angew. Chem., Int. Ed.
, vol.40
, pp. 2316
-
-
Holmlin, R.E.1
Ismagilov, R.F.2
Haag, R.3
Mujica, V.4
Ratner, M.A.5
Rampi, M.A.6
Whitesides, G.M.7
-
15
-
-
0037181383
-
-
Selzer, Y.; Salomon, A.; Cahen, D. J. Am. Chem. Soc. 2002, 124, 2886. J. Phys. Chem. B 2002, 106, 10432.
-
(2002)
J. Am. Chem. Soc.
, vol.124
, pp. 2886
-
-
Selzer, Y.1
Salomon, A.2
Cahen, D.3
-
16
-
-
0037058059
-
-
Selzer, Y.; Salomon, A.; Cahen, D. J. Am. Chem. Soc. 2002, 124, 2886. J. Phys. Chem. B 2002, 106, 10432.
-
(2002)
J. Phys. Chem. B
, vol.106
, pp. 10432
-
-
-
17
-
-
0038164080
-
Resonant tunneling and molecular rectification in Langmuir-Blodgett films
-
Jortner, J., Ratner, M., Eds.; Blackwell Science: Oxford, U.K.
-
Roth, S.; Burghard, M.; Fischer, C. M. Resonant tunneling and molecular rectification in Langmuir-Blodgett films. In Molecular electronics; Jortner, J., Ratner, M., Eds.; Blackwell Science: Oxford, U.K., 1997; p 255.
-
(1997)
Molecular Electronics
, pp. 255
-
-
Roth, S.1
Burghard, M.2
Fischer, C.M.3
-
18
-
-
0034697672
-
-
Wong, E. W.; Collier, C. P.; Behloradsky, M.; Raymo, F. M.; Stoddart, J. F.; Heath, J. R. J. Am. Chem. Soc. 2000, 122, 5831.
-
(2000)
J. Am. Chem. Soc.
, vol.122
, pp. 5831
-
-
Wong, E.W.1
Collier, C.P.2
Behloradsky, M.3
Raymo, F.M.4
Stoddart, J.F.5
Heath, J.R.6
-
19
-
-
0034682887
-
-
Collier, C. P.; Mattersteig, G.; Wong, E. W.; Luo, Y.; Beverly, K.; Sampaio, J.; Raymo, F. M.; Stoddart, J. F.; Heath, J. R. Science 2000, 289, 1172.
-
(2000)
Science
, vol.289
, pp. 1172
-
-
Collier, C.P.1
Mattersteig, G.2
Wong, E.W.3
Luo, Y.4
Beverly, K.5
Sampaio, J.6
Raymo, F.M.7
Stoddart, J.F.8
Heath, J.R.9
-
21
-
-
0000854678
-
-
Evans, S. D.; Urankar, E.; Ulman, A.; Ferris, N. J. Am. Chem. Soc. 1991, 113, 4121.
-
(1991)
J. Am. Chem. Soc.
, vol.113
, pp. 4121
-
-
Evans, S.D.1
Urankar, E.2
Ulman, A.3
Ferris, N.4
-
22
-
-
0034228257
-
-
Seker, S.; Meeker, K.; Keuch, T. F.; Ellis, A. B. Chem. Rev. 2000, 100, 2505.
-
(2000)
Chem. Rev.
, vol.100
, pp. 2505
-
-
Seker, S.1
Meeker, K.2
Keuch, T.F.3
Ellis, A.B.4
-
23
-
-
0038164081
-
-
note
-
We use the term molecular layer (MoL) instead of monolayer (ML), to stress the difference between these layers, on the one hand, and nearperfectly ordered monolayers with both local and long-range order, on the other hand. In our case, there is average order, perpendicular to the binding surface, because we use ligands with a well-defined binding site. We followed adsorption procedures to avoid multilayers on the surface. Total coverage can vary from 0.75 to 1 monolayer, depending on the binding groups, substituents, and substrate.
-
-
-
-
24
-
-
0028766285
-
-
Bruening, M.; Moons, E.; Yaron-Marcovich, D.; Cahen, D.; Libman, J.; Shanzer, A. J. Am. Chem. Soc. 1994, 116, 2972.
-
(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 2972
-
-
Bruening, M.1
Moons, E.2
Yaron-Marcovich, D.3
Cahen, D.4
Libman, J.5
Shanzer, A.6
-
26
-
-
0036180508
-
-
Ashkenasy, G.; Cahen, D.; Cohen, R.; Shanzer, A.; Vilan, A. Acc. Chem. Res. 2002, 35, 121.
-
(2002)
Acc. Chem. Res.
, vol.35
, pp. 121
-
-
Ashkenasy, G.1
Cahen, D.2
Cohen, R.3
Shanzer, A.4
Vilan, A.5
-
27
-
-
0033875845
-
-
Cohen, R.; Kronik, L.; Vilan, A.; Shanzer, A.; Cahen, D. Adv. Mater. 2000, 12, 33.
-
(2000)
Adv. Mater.
, vol.12
, pp. 33
-
-
Cohen, R.1
Kronik, L.2
Vilan, A.3
Shanzer, A.4
Cahen, D.5
-
28
-
-
0035867232
-
-
Carrara, M.; Nuesch, F.; Zuppiroli, L. Synth. Met. 2001, 121, 1633.
-
(2001)
Synth. Met.
, vol.121
, pp. 1633
-
-
Carrara, M.1
Nuesch, F.2
Zuppiroli, L.3
-
29
-
-
0021479259
-
-
Winter, C.; Tredgold, R.; Hodge, P.; Khoshdel, E. IEE Proc. Pt. I 1984, 131, 125.
-
(1984)
IEE Proc. Pt. I
, vol.131
, pp. 125
-
-
Winter, C.1
Tredgold, R.2
Hodge, P.3
Khoshdel, E.4
-
33
-
-
0011336568
-
-
Ishii, H.; Sugiyama, K.; Ito, E.; Seki, K. Adv. Mater. 1999, 11, 605.
-
(1999)
Adv. Mater.
, vol.11
, pp. 605
-
-
Ishii, H.1
Sugiyama, K.2
Ito, E.3
Seki, K.4
-
34
-
-
3342994284
-
-
Hill, I. G.; Rajagopal, A.; Kahn, A. J. Appl. Phys. 1998, 84, 3236.
-
(1998)
J. Appl. Phys.
, vol.84
, pp. 3236
-
-
Hill, I.G.1
Rajagopal, A.2
Kahn, A.3
-
35
-
-
0037205567
-
-
Schlettwein, D.; Hesse, K.; Gruhn, N. E.; Lee, P. A.; Nebesny, K. W.; Armstrong, N. R. J. Phys. Chem. B 2001, 105, 4791.
-
(2001)
J. Phys. Chem. B
, vol.105
, pp. 4791
-
-
Schlettwein, D.1
Hesse, K.2
Gruhn, N.E.3
Lee, P.A.4
Nebesny, K.W.5
Armstrong, N.R.6
-
36
-
-
0031343407
-
-
Campbell, L. H.; Kress, J. D.; Martin, R. L.; Smith, D. L.; Barashkov, N. N.; Ferraris, J. P. Appl. Phys. Lett. 1997, 71, 3528.
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 3528
-
-
Campbell, L.H.1
Kress, J.D.2
Martin, R.L.3
Smith, D.L.4
Barashkov, N.N.5
Ferraris, J.P.6
-
37
-
-
0000429538
-
-
Campbell, L. H.; Rubin, S.; Zawodzinski, T. A.; Kress, J. D.; Martin, R. L.; Smith, D. L.; Barashkov, N. N.; Ferraris, J. P. Phys. Rev. B 1996, 54, 14321.
-
(1996)
Phys. Rev. B
, vol.54
, pp. 14321
-
-
Campbell, L.H.1
Rubin, S.2
Zawodzinski, T.A.3
Kress, J.D.4
Martin, R.L.5
Smith, D.L.6
Barashkov, N.N.7
Ferraris, J.P.8
-
38
-
-
0032577109
-
-
Nuesch, F.; Rotzinger, F.; Si-Ahmed, L.; Zuppiroli, L. Chem. Phys. Lett. 1998, 288, 861.
-
(1998)
Chem. Phys. Lett.
, vol.288
, pp. 861
-
-
Nuesch, F.1
Rotzinger, F.2
Si-Ahmed, L.3
Zuppiroli, L.4
-
39
-
-
0001272121
-
-
Zuppiroli, L.; Si-Ahmed, L.; Kamaras, K.; Nuesch, F.; Bussac, M.; Ades, D.; Siove, A.; Moons, E.; Gratzel, M. Eur. Phys. J. B 1999, 11, 505.
-
(1999)
Eur. Phys. J. B
, vol.11
, pp. 505
-
-
Zuppiroli, L.1
Si-Ahmed, L.2
Kamaras, K.3
Nuesch, F.4
Bussac, M.5
Ades, D.6
Siove, A.7
Moons, E.8
Gratzel, M.9
-
40
-
-
0001753097
-
-
Gal, D.; Sone, E.; Cohen, R.; Hodes, G.; Libman, J.; Shanzer, A.; Schock, H. W.; Cahen, D. Proc. Ind. Acad. Sci. Chem. Sci. 1997, 109, 487.
-
(1997)
Proc. Ind. Acad. Sci. Chem. Sci.
, vol.109
, pp. 487
-
-
Gal, D.1
Sone, E.2
Cohen, R.3
Hodes, G.4
Libman, J.5
Shanzer, A.6
Schock, H.W.7
Cahen, D.8
-
41
-
-
0037960431
-
-
Krüger, J.; Bach, U.; Grätzel, M. Adv. Mater. 2000, 12, 447.
-
(2000)
Adv. Mater.
, vol.12
, pp. 447
-
-
Krüger, J.1
Bach, U.2
Grätzel, M.3
-
42
-
-
0035832965
-
-
Ganzorig, C.; Kwak, K. J.; Yagi, K.; Fujihira, M. Appl. Phys. Lett. 2001, 79, 272.
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 272
-
-
Ganzorig, C.1
Kwak, K.J.2
Yagi, K.3
Fujihira, M.4
-
43
-
-
0000401787
-
-
Nuesch, F.; Forsythe, E. W.; Le, Q. T.; Gao, Y.; Rothberg, L. J. J. Appl. Phys. 2000, 87, 7973.
-
(2000)
J. Appl. Phys.
, vol.87
, pp. 7973
-
-
Nuesch, F.1
Forsythe, E.W.2
Le, Q.T.3
Gao, Y.4
Rothberg, L.J.5
-
45
-
-
0034624790
-
-
Vilan, A.; Shanzer, A.; Cahen, D. Nature 2000, 404, 166.
-
(2000)
Nature
, vol.404
, pp. 166
-
-
Vilan, A.1
Shanzer, A.2
Cahen, D.3
-
46
-
-
0035819208
-
-
Wu, D. G.; Ghabboun, J.; Martin, J. M. L.; Cahen, D. J. Phys. Chem. B 2001, 105, 12011.
-
(2001)
J. Phys. Chem. B
, vol.105
, pp. 12011
-
-
Wu, D.G.1
Ghabboun, J.2
Martin, J.M.L.3
Cahen, D.4
-
47
-
-
0037024350
-
-
Bonifazi, D.; Salomon, A.; Enger, O.; Diederich, F.; Cahen, D. Adv. Mater. 2002, 14, 802.
-
(2002)
Adv. Mater.
, vol.14
, pp. 802
-
-
Bonifazi, D.1
Salomon, A.2
Enger, O.3
Diederich, F.4
Cahen, D.5
-
53
-
-
0014524145
-
-
Kurtin, S.; McGill, T. C.; Mead, C. A. Phys. Rev. Lett. 1970, 22, 1433.
-
(1970)
Phys. Rev. Lett.
, vol.22
, pp. 1433
-
-
Kurtin, S.1
McGill, T.C.2
Mead, C.A.3
-
54
-
-
0033579113
-
-
Cohen, R.; Kronik, L.; Shanzer, A.; Cahen, D.; Liu, A.; Rosenwaks, Y.; Lorenz, J.; Ellis, A. B. J. Am. Chem. Soc. 1999, 121, 10545.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, pp. 10545
-
-
Cohen, R.1
Kronik, L.2
Shanzer, A.3
Cahen, D.4
Liu, A.5
Rosenwaks, Y.6
Lorenz, J.7
Ellis, A.B.8
-
55
-
-
0000311936
-
-
Bastide, S.; Butruille, R.; Cahen, D.; Dutta, A.; Libman, J.; Shanzer, A.; Sun, L.; Vilan, A. J. Phys. Chem. 1997, 101, 2678.
-
(1997)
J. Phys. Chem.
, vol.101
, pp. 2678
-
-
Bastide, S.1
Butruille, R.2
Cahen, D.3
Dutta, A.4
Libman, J.5
Shanzer, A.6
Sun, L.7
Vilan, A.8
-
56
-
-
11644294103
-
-
Vilan, A.; Ussyshkin, R.; Gartsman, K.; Cahen, D.; Naaman, R.; Shanzer, A. J. Phys. Chem. 1998, 102, 3307.
-
(1998)
J. Phys. Chem.
, vol.102
, pp. 3307
-
-
Vilan, A.1
Ussyshkin, R.2
Gartsman, K.3
Cahen, D.4
Naaman, R.5
Shanzer, A.6
-
57
-
-
0037488775
-
-
note
-
2O to the acetonitrile solution will precipitate the nonsubstituted (H) dC ligands as a thick layer on the surface.
-
-
-
-
59
-
-
0033536458
-
-
Hooper, A.; Fisher, G. L.; Konstadinidis, K.; Jung, D.; Nguyen, H.; Opila, R.; Collins, R. W.; Winograd, N.; Allara, D. L. J. Am. Chem. Soc. 1999, 121, 8052.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, pp. 8052
-
-
Hooper, A.1
Fisher, G.L.2
Konstadinidis, K.3
Jung, D.4
Nguyen, H.5
Opila, R.6
Collins, R.W.7
Winograd, N.8
Allara, D.L.9
-
62
-
-
0036495326
-
-
Selzer, Y.; Salomon, A.; Ghabboun, J.; Cahen, D. Angew. Chem., Int. Ed. 2002, 41, 827.
-
(2002)
Angew. Chem., Int. Ed.
, vol.41
, pp. 827
-
-
Selzer, Y.1
Salomon, A.2
Ghabboun, J.3
Cahen, D.4
-
63
-
-
0037826330
-
-
Gaussian, Inc: Pittsburgh, PA
-
Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Scuseria, G. E.; Robb, M. A.; Cheeseman, J. R.; Zakrzewski, V. G.; Montgomery, J. A.; Stratmann, R. E.; Burant, J. C.; Dapprich, S.; Millam, J. M.; Daniels, A. D.; Kudin, K. N.; Strain, M. C.; Farkas, O.; Tomasi, J.; Barone, V.; Cossi, M.; Cammi, R.; Mennucci, B.; Pomelli, C.; Adamo, C.; Clifford, S.; Ochterski, J.; Petersson, G. A.; Ayala, P. Y.; Cui, Q.; Morokuma, K.; Malick, D. K.; Rabuck, A. D.; Raghavachari, K.; Foresman, J. B.; Cioslowski, J.; Ortiz, J. V.; Baboul, A. G.; Stefanov, B. B.; Liu, G.; Liashenko, A.; Piskorz, P.; Komaromi, I.; Gomperts, R.; Martin, R. L.; Fox, D.; Keith, T.; Al-Laham, M. A.; Peng, C. Y.; Nanayakkara, A.; Gonzalez, C.; Challacombe, M.; Gill, P. M. W.; Johnson, B.; Chen, W.; Wong, M. W.; Andres, J. L.; Gonzalez, C.; Head-Gordon, M.; Replogle, E. S.; Pople, J. A. Gaussian 98, revision A.7 ed.; Gaussian, Inc: Pittsburgh, PA, 1998.
-
(1998)
Gaussian 98, Revision A.7 Ed.
-
-
Frisch, M.J.1
Trucks, G.W.2
Schlegel, H.B.3
Scuseria, G.E.4
Robb, M.A.5
Cheeseman, J.R.6
Zakrzewski, V.G.7
Montgomery, J.A.8
Stratmann, R.E.9
Burant, J.C.10
Dapprich, S.11
Millam, J.M.12
Daniels, A.D.13
Kudin, K.N.14
Strain, M.C.15
Farkas, O.16
Tomasi, J.17
Barone, V.18
Cossi, M.19
Cammi, R.20
Mennucci, B.21
Pomelli, C.22
Adamo, C.23
Clifford, S.24
Ochterski, J.25
Petersson, G.A.26
Ayala, P.Y.27
Cui, Q.28
Morokuma, K.29
Malick, D.K.30
Rabuck, A.D.31
Raghavachari, K.32
Foresman, J.B.33
Cioslowski, J.34
Ortiz, J.V.35
Baboul, A.G.36
Stefanov, B.B.37
Liu, G.38
Liashenko, A.39
Piskorz, P.40
Komaromi, I.41
Gomperts, R.42
Martin, R.L.43
Fox, D.44
Keith, T.45
Al-Laham, M.A.46
Peng, C.Y.47
Nanayakkara, A.48
Gonzalez, C.49
Challacombe, M.50
Gill, P.M.W.51
Johnson, B.52
Chen, W.53
Wong, M.W.54
Andres, J.L.55
Gonzalez, C.56
Head-Gordon, M.57
Replogle, E.S.58
Pople, J.A.59
more..
-
68
-
-
85087594747
-
-
note
-
-30 C·m, which is the MKS unit for the dipole moment.
-
-
-
-
69
-
-
0037488774
-
-
note
-
XPS confirmed the presence and the stoichiometry of the adsorbed molecules with their substituent elements (e.g., N, F) at their outside, on top of an oxide layer composed of Ga and As in lower (than III) oxidation state. The thickness extracted based on different elements varies slightly and was 10 ± 4 Å for both the MoL and the oxide, in agreement with our ellipsometry data (cf. supplementary information).
-
-
-
-
71
-
-
0038502688
-
-
note
-
Supply and other technical problems prevented us from collecting the complete series of data, including the OMe derivative, for vacuum evaporation without Ar.
-
-
-
-
76
-
-
0032115488
-
-
Myburg, G.; Auret, F. D.; Meyer, W. E.; Louw, C. W.; van Staden, M. J. Thin Solid Films 1998, 325, 181.
-
(1998)
Thin Solid Films
, vol.325
, pp. 181
-
-
Myburg, G.1
Auret, F.D.2
Meyer, W.E.3
Louw, C.W.4
Van Staden, M.J.5
-
77
-
-
0011288042
-
-
Chang, S.; Raisanen, A.; Brillson, L. J.; Shaw, J. L.; Kirchner, P. D.; Pettit, G. D.; Woodall, J. M. J. Vac. Sci. Technol. B 1992, 10, 1932.
-
(1992)
J. Vac. Sci. Technol. B
, vol.10
, pp. 1932
-
-
Chang, S.1
Raisanen, A.2
Brillson, L.J.3
Shaw, J.L.4
Kirchner, P.D.5
Pettit, G.D.6
Woodall, J.M.7
-
78
-
-
0008334073
-
-
Viturro, R. E.; Chang, J. L.; Shaw, J. L.; Mailhiot, C.; Brillson, L. J. J. Vac. Sci. Technol. B 1989, 7, 1007.
-
(1989)
J. Vac. Sci. Technol. B
, vol.7
, pp. 1007
-
-
Viturro, R.E.1
Chang, J.L.2
Shaw, J.L.3
Mailhiot, C.4
Brillson, L.J.5
-
79
-
-
0001238087
-
-
Chang, S.; Brillson, L. J.; Kime, Y. J.; Rioux, D. S.; Kirchner, P. D.; Pettit, G. D.; Woodall, J. M. Phys. Rev. Lett. 1990, 64, 2551.
-
(1990)
Phys. Rev. Lett.
, vol.64
, pp. 2551
-
-
Chang, S.1
Brillson, L.J.2
Kime, Y.J.3
Rioux, D.S.4
Kirchner, P.D.5
Pettit, G.D.6
Woodall, J.M.7
-
80
-
-
0038164076
-
-
note
-
Estimates of the contact area, independent of the barrier height can be gotten by measuring the I-V characteristics as a function of temperature, or use of additional methods such as capacitance-voltage and internal photoemission measurements. We have experimented with both temperature-dependent I-V and capacitance-voltage measurements and find their interpretation to be even less straightforward than that of the current-voltage ones. Thus, though definitely worthwhile, they will require a major further effort to bear fruit.
-
-
-
-
81
-
-
0018997459
-
-
Dharmadasa, I. M.; Roberts, G. O.; Petty, M. C. Electron. Lett. 1980, 16, 201.
-
(1980)
Electron. Lett.
, vol.16
, pp. 201
-
-
Dharmadasa, I.M.1
Roberts, G.O.2
Petty, M.C.3
-
82
-
-
0001730357
-
-
Iwamoto, M.; Mizutani, Y.; Sugimura, A. Phys. Rev. B 1996, 54, 8186.
-
(1996)
Phys. Rev. B
, vol.54
, pp. 8186
-
-
Iwamoto, M.1
Mizutani, Y.2
Sugimura, A.3
-
83
-
-
0030760359
-
-
Bruening, M.; Cohen, R.; Guillemoles, J. F.; Moav, T.; Libman, J.; Shanzer, A.; Cahen, D. J. Am. Chem. Soc. 1997, 119, 5720.
-
(1997)
J. Am. Chem. Soc.
, vol.119
, pp. 5720
-
-
Bruening, M.1
Cohen, R.2
Guillemoles, J.F.3
Moav, T.4
Libman, J.5
Shanzer, A.6
Cahen, D.7
-
85
-
-
0028409579
-
-
dell'Orto, T.; Almeida, J.; Coluzza, C.; Baldereschi, A.; Maragaritondo, G.; Cantile, M.; Yildirim, S.; Sorba, L.; Franciosi, A. Appl. Phys. Lett. 1994, 64, 2111.
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 2111
-
-
Dell'orto, T.1
Almeida, J.2
Coluzza, C.3
Baldereschi, A.4
Maragaritondo, G.5
Cantile, M.6
Yildirim, S.7
Sorba, L.8
Franciosi, A.9
-
89
-
-
0037826324
-
-
note
-
The slope values were extracted by us from the experimental data of Myburg et al.
-
-
-
-
90
-
-
0038164065
-
-
note
-
This procedure was found to give cleaner and smoother surfaces under nonclean room conditions.
-
-
-
-
91
-
-
0037488766
-
-
note
-
We take the energy difference between the neutral molecule and the radical anion, formed by adding an electron to it, as the electron affinity of a molecule, in calculations relaxation effects are neglected and the calculations are for the geometry of the neutral species; cf. also Vondrak et al.
-
-
-
-
92
-
-
0001182739
-
-
Vondrak, T.; Cramer, C. J.; Zhu, X. Y. J. Phys. Chem. B 1999, 103, 8915.
-
(1999)
J. Phys. Chem. B
, vol.103
, pp. 8915
-
-
Vondrak, T.1
Cramer, C.J.2
Zhu, X.Y.3
-
94
-
-
85087596393
-
-
note
-
94).
-
-
-
-
95
-
-
0001693057
-
-
Miedema, A. R.; De Boer, F. R.; De Chatel, P. F. J. Phys. F 1973, 3, 1558.
-
(1973)
J. Phys. F
, vol.3
, pp. 1558
-
-
Miedema, A.R.1
De Boer, F.R.2
De Chatel, P.F.3
-
96
-
-
0035128076
-
-
Blyth, R. I. R.; Mittendorfer, F.; Hafner, J. H.; Sardar, S. A.; Duschek, R.; Netzer, F. P.; Ramsey, M. G. J. Chem. Phys. 2001, 114, 935.
-
(2001)
J. Chem. Phys.
, vol.114
, pp. 935
-
-
Blyth, R.I.R.1
Mittendorfer, F.2
Hafner, J.H.3
Sardar, S.A.4
Duschek, R.5
Netzer, F.P.6
Ramsey, M.G.7
-
97
-
-
0034671753
-
-
Wu, D. G.; Ashkenasy, G.; Shvarts, D.; Ussyshkin, R. V.; Naaman, R.; Shanzer, A.; Cahen, D. Angew. Chem., Int. Ed. 2000, 39, 4496.
-
(2000)
Angew. Chem., Int. Ed.
, vol.39
, pp. 4496
-
-
Wu, D.G.1
Ashkenasy, G.2
Shvarts, D.3
Ussyshkin, R.V.4
Naaman, R.5
Shanzer, A.6
Cahen, D.7
-
98
-
-
0006385547
-
-
Wu, D.; Cahen, D.; Graf, P.; R. Naaman, R.; Nitzan, A.; Shvarts, D. Chem., Eur. J. 2001, 7, 1743.
-
(2001)
Chem., Eur. J.
, vol.7
, pp. 1743
-
-
Wu, D.1
Cahen, D.2
Graf, P.3
Naaman, R.4
Nitzan, A.5
Shvarts, D.6
-
99
-
-
4243552774
-
-
Gartsman, K.; Cahen, D.; Kadyshevitch, A.; Libman, J.; Moav, T.; Naaman, R.; Shanzer, A.; Umansky, V.; Vilan, A. Chem. Phys. Lett. 1997, 285, 301.
-
(1997)
Chem. Phys. Lett.
, vol.285
, pp. 301
-
-
Gartsman, K.1
Cahen, D.2
Kadyshevitch, A.3
Libman, J.4
Moav, T.5
Naaman, R.6
Shanzer, A.7
Umansky, V.8
Vilan, A.9
-
100
-
-
0034667131
-
-
De Renzi, V.; Biagi, R.; del Pennino, U.; Pedio, M.; Goldoni, A.; Larciprete, R. Phys. Rev. B 2000, 62, R10657.
-
(2000)
Phys. Rev. B
, vol.62
-
-
De Renzi, V.1
Biagi, R.2
Del Pennino, U.3
Pedio, M.4
Goldoni, A.5
Larciprete, R.6
|