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Volumn 85, Issue 22, 2004, Pages 5149-5151

High-power 1.3-μm InGaAsN strain-compensated lasers fabricated with pulsed anodic oxidation

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CHEMICAL VAPOR DEPOSITION; CURRENT DENSITY; ELECTRIC EXCITATION; ENERGY GAP; LASER APPLICATIONS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OXIDATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS;

EID: 11044237375     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1828596     Document Type: Article
Times cited : (17)

References (24)
  • 24
    • 11044228391 scopus 로고    scopus 로고
    • note
    • Broad-area (50-μm-wide contact stripe) InGaAsN lasers with single, double, and triple QWs were fabricated from wafers grown by IQE Europe Ltd. No current blocking layer was used. For 1200-μm-long lasers, the slope efficiency was 0.096, 0.050, and 0.118 W/A, respectively, private communication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.