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Volumn 36, Issue 1-2, 2004, Pages 45-55

Thermal cycling response of layered gold/polysilicon MEMS structures

Author keywords

[No Author keywords available]

Indexed keywords

GOLD; POLYSILICON; THERMAL CYCLING; THERMAL EXPANSION;

EID: 10744231496     PISSN: 01676636     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-6636(03)00030-9     Document Type: Conference Paper
Times cited : (28)

References (23)
  • 1
    • 0041323894 scopus 로고    scopus 로고
    • Optical power induced damage to microelectromechanical mirrors
    • Burns D.M., Bright V.M. Optical power induced damage to microelectromechanical mirrors. Sens. Actuator A: Phys. 70:1998;6.
    • (1998) Sens. Actuator A: Phys. , vol.70 , pp. 6
    • Burns, D.M.1    Bright, V.M.2
  • 2
    • 0242358198 scopus 로고    scopus 로고
    • Deformation and structural stability of gold/polysilicon plate structures subjected to thermal loading
    • C. Muhlstein, Brown S.B. West Conshohocken, PA: American Society for Testing and Materials
    • Dunn M.L., Zhang Y., Bright V. Deformation and structural stability of gold/polysilicon plate structures subjected to thermal loading. Muhlstein C., Brown S.B. ASTM STP 1413. 2001;American Society for Testing and Materials, West Conshohocken, PA.
    • (2001) ASTM STP 1413
    • Dunn, M.L.1    Zhang, Y.2    Bright, V.3
  • 3
    • 0036684785 scopus 로고    scopus 로고
    • Deformation and structural stability of layered plate microstructures subjected to thermal loading
    • Dunn M.L., Zhang Y., Bright V. Deformation and structural stability of layered plate microstructures subjected to thermal loading. J. Microelectromech. Syst. 11:2002;372.
    • (2002) J. Microelectromech. Syst. , vol.11 , pp. 372
    • Dunn, M.L.1    Zhang, Y.2    Bright, V.3
  • 4
    • 0031236627 scopus 로고    scopus 로고
    • Effect of interface undulations on the thermal fatigue of thin films and scales on metal substrates
    • Evans A.G., He M.Y., Hutchinson J.W. Effect of interface undulations on the thermal fatigue of thin films and scales on metal substrates. Acta Mater. 45:1997;3543.
    • (1997) Acta Mater. , vol.45 , pp. 3543
    • Evans, A.G.1    He, M.Y.2    Hutchinson, J.W.3
  • 5
    • 0030141309 scopus 로고    scopus 로고
    • Small and large deformation of thick and thin film multilayers: Effect of layer geometry, plasticity, and compositional gradients
    • Finot M., Suresh S. Small and large deformation of thick and thin film multilayers: effect of layer geometry, plasticity, and compositional gradients. J. Mech. Phys. Solids. 44:1996;683.
    • (1996) J. Mech. Phys. Solids , vol.44 , pp. 683
    • Finot, M.1    Suresh, S.2
  • 6
    • 0033907470 scopus 로고    scopus 로고
    • Substrate curvature due to thin film mismatch strain in the nonlinear deformation range
    • Freund L.B. Substrate curvature due to thin film mismatch strain in the nonlinear deformation range. J. Mech. Phys. Solids. 48:2000;1159.
    • (2000) J. Mech. Phys. Solids , vol.48 , pp. 1159
    • Freund, L.B.1
  • 7
    • 0032476331 scopus 로고    scopus 로고
    • Direct observation of diffusional creep via TEM in polycrystalline thin films of gold
    • Harris K.E., King A.H. Direct observation of diffusional creep via TEM in polycrystalline thin films of gold. Acta Mater. 46:1998;6195.
    • (1998) Acta Mater. , vol.46 , pp. 6195
    • Harris, K.E.1    King, A.H.2
  • 8
    • 0033737954 scopus 로고    scopus 로고
    • The ratcheting of compressed thermally grown thin films on ductile substrates
    • He M.Y., Evans A.G., Hutchinson J.W. The ratcheting of compressed thermally grown thin films on ductile substrates. Acta Mater. 48:1997;2593.
    • (1997) Acta Mater. , vol.48 , pp. 2593
    • He, M.Y.1    Evans, A.G.2    Hutchinson, J.W.3
  • 9
    • 0032623850 scopus 로고    scopus 로고
    • A new method to study cyclic deformation of thin films in tension and compression
    • Hommel M., Kraft O., Arzt E. A new method to study cyclic deformation of thin films in tension and compression. J. Mater. Res. 14:1999;2373.
    • (1999) J. Mater. Res. , vol.14 , pp. 2373
    • Hommel, M.1    Kraft, O.2    Arzt, E.3
  • 10
    • 0032714755 scopus 로고    scopus 로고
    • Stress-temperature behavior of unpassivated thin copper films
    • Keller R.-M., Baker S.P., Arzt E. Stress-temperature behavior of unpassivated thin copper films. Acta Mater. 47:1999;415.
    • (1999) Acta Mater. , vol.47 , pp. 415
    • Keller, R.-M.1    Baker, S.P.2    Arzt, E.3
  • 11
    • 0032205854 scopus 로고    scopus 로고
    • Thermal cycling fatigue and deformation mechanism in aluminum alloy thin films on silicon
    • Koike J., Utsunomiya S., Shimoyama Y., Maruyama K., Oikawa H. Thermal cycling fatigue and deformation mechanism in aluminum alloy thin films on silicon. J. Mater. Res. 13:1998;3256.
    • (1998) J. Mater. Res. , vol.13 , pp. 3256
    • Koike, J.1    Utsunomiya, S.2    Shimoyama, Y.3    Maruyama, K.4    Oikawa, H.5
  • 13
    • 0001410007 scopus 로고    scopus 로고
    • A search for strain gradients in gold thin films on substrates using X-ray diffraction
    • Leung O.S., Munkholm A., Brennan S., Nix W.D. A search for strain gradients in gold thin films on substrates using X-ray diffraction. J. Appl. Phys. 88:2000;1389.
    • (2000) J. Appl. Phys. , vol.88 , pp. 1389
    • Leung, O.S.1    Munkholm, A.2    Brennan, S.3    Nix, W.D.4
  • 14
    • 0035281099 scopus 로고    scopus 로고
    • Micromachined, flip-chip assembled, actuatable contacts for use in high density interconnection in electronics packaging
    • Miller D.C., Zhang W.G., Bright V.M. Micromachined, flip-chip assembled, actuatable contacts for use in high density interconnection in electronics packaging. Sens. Actuator A: Phys. 89:2001;76.
    • (2001) Sens. Actuator A: Phys. , vol.89 , pp. 76
    • Miller, D.C.1    Zhang, W.G.2    Bright, V.M.3
  • 15
    • 0024766321 scopus 로고
    • Mechanical properties of thin films
    • Nix W.D. Mechanical properties of thin films. Metall. Trans. A. 20:1989;2217.
    • (1989) Metall. Trans. A , vol.20 , pp. 2217
    • Nix, W.D.1
  • 16
    • 0032026416 scopus 로고    scopus 로고
    • Tension-tension fatigue of copper thin films
    • Read D.T. Tension-tension fatigue of copper thin films. Int. J. Fatigue. 20:1998;203.
    • (1998) Int. J. Fatigue , vol.20 , pp. 203
    • Read, D.T.1
  • 17
    • 0029255919 scopus 로고
    • Bifurcation in isotropic thin film/substrate plates
    • Salamon N.J., Masters C.B. Bifurcation in isotropic thin film/substrate plates. Int. J. Solids Struct. 32:1995;473.
    • (1995) Int. J. Solids Struct. , vol.32 , pp. 473
    • Salamon, N.J.1    Masters, C.B.2
  • 18
    • 0033360775 scopus 로고    scopus 로고
    • High cycle fatigue of thin silver films investigated by dynamic microbeam deflection
    • Schwaiger R., Kraft O. High cycle fatigue of thin silver films investigated by dynamic microbeam deflection. Scr. Mater. 41:1999;823.
    • (1999) Scr. Mater. , vol.41 , pp. 823
    • Schwaiger, R.1    Kraft, O.2
  • 20
    • 0000073841 scopus 로고
    • The tension of metallic films deposited by electrolysis
    • Stoney G.G. The tension of metallic films deposited by electrolysis. Proc. R. Soc. London A. 82:1909;172.
    • (1909) Proc. R. Soc. London A , vol.82 , pp. 172
    • Stoney, G.G.1
  • 21
    • 0027642069 scopus 로고
    • Stress development and relaxation in copper films during thermal cycling
    • Thouless M.D., Gupta J., Harper J.M.E. Stress development and relaxation in copper films during thermal cycling. J. Mater. Res. 8:1993;1845.
    • (1993) J. Mater. Res. , vol.8 , pp. 1845
    • Thouless, M.D.1    Gupta, J.2    Harper, J.M.E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.