High cycle fatigue of thin silver films investigated by dynamic microbeam deflection

Scripta Materialia

Volumn 41, Issue 8, 1999, Pages 823-829

  Schwaiger, R ^a   Kraft, O ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; DISLOCATIONS (CRYSTALS); FATIGUE TESTING; POINT DEFECTS; RESIDUAL STRESSES; SILICA; SILVER; STIFFNESS; STRAIN; STRESS ANALYSIS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CONTINUOUS STIFFNESS MEASUREMENT (CSM); DYNAMIC MICROBEAM DEFLECTION;

METALLIC FILMS;

EID: 0033360775     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(99)00231-6     Document Type: Article

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