Tension-tension fatigue of copper thin films

International Journal of Fatigue

Volumn 20, Issue 3, 1998, Pages 203-209

  Read, D T ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Closed loop testing; Cyclic; Displacement; Endurance; Force; Piezoelectric; S N curve; Servo; Strain; Stress

Indexed keywords

ACTUATORS; CLOSED LOOP CONTROL SYSTEMS; COPPER; ELASTIC MODULI; FATIGUE TESTING; FEEDBACK CONTROL; PIEZOELECTRIC DEVICES; POLYCRYSTALLINE MATERIALS; TENSILE STRENGTH; THIN FILMS;

ELECTRON BEAM EVAPORATED COPPER; PIEZOELECTRIC ACTUATORS;

METALLIC FILMS;

EID: 0032026416     PISSN: 01421123     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0142-1123(97)00080-7     Document Type: Article

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