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Volumn 46, Issue 17, 1998, Pages 6195-6203
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Direct observation of diffusional creep via TEM in polycrystalline thin films of gold
a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL WHISKERS;
FILM GROWTH;
GOLD;
INTERFACIAL ENERGY;
POLYCRYSTALLINE MATERIALS;
STRAIN RATE;
STRESS ANALYSIS;
STRETCHING;
TRANSMISSION ELECTRON MICROSCOPY;
ZERO-CREEP STRESSES;
METALLIC FILMS;
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EID: 0032476331
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6454(98)00270-5 Document Type: Article |
Times cited : (40)
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References (23)
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