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Applied Physics Letters

Volumn 69, Issue 20, 1996, Pages 2953-2955

Study of nonlinear optical effects in GaN:Mg epitaxial film

(6) Zhang, H Y a He, X H a Shih, Y H a Schurman, M b Feng, Z C b Stall, R A b

a UNIVERSITY OF MARYLAND BALTIMORE COUNTY (United States)

b EMCORE CORPORATION (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; CRYSTALLINE MATERIALS; LIGHT POLARIZATION; NEODYMIUM LASERS; NONLINEAR OPTICS; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; SECOND HARMONIC GENERATION; SEMICONDUCTING FILMS; WAVEGUIDES;

GALLIUM NITRIDE; INCIDENT ANGLE; MAKER FRINGE METHOD; SECOND ORDER NONLINEAR OPTICAL COEFFICIENTS; TRANSVERSE ELECTRIC MODE; TRANSVERSE MAGNETIC MODE;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0030287347 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.117741 Document Type: Article

Times cited : (65)

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