Identification and Annealing of Common Intrinsic Defect Centers

Materials Science Forum

Volumn 433-436, Issue , 2003, Pages 471-476

  Bockstedte, Michel ^a   Heid, Matthias ^a   Mattausch, Alexander ^a   Pankratov, Oleg ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Annealing Mechanism; Antisite; Hyperfine Parameter; Vacancies

Indexed keywords

ANNEALING; DEFECTS; PARAMAGNETISM; REACTION KINETICS;

INTRINSIC DEFECTS;

SILICON CARBIDE;

EID: 0242628983     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.433-436.471     Document Type: Conference Paper

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