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Volumn 40, Issue 26, 2003, Pages 7315-7327

A thermodynamic model for electrical current induced damage

Author keywords

Damage mechanics; Diffusion; Electromigration; Nanoelectronics; Nanomechanics; Solder joints; Void growth

Indexed keywords

CURRENT DENSITY; ELECTROMIGRATION; MATHEMATICAL MODELS; SOLDERED JOINTS; THERMODYNAMICS;

EID: 0242406944     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijsolstr.2003.08.018     Document Type: Article
Times cited : (110)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.