-
3
-
-
0012586650
-
-
NATO Advanced Study Institute, Series E: Applied Sciences, Martinus Nijhoff, Boston, MA
-
F. L. Riley (ed.), Progress in Nitrogen Ceramics, NATO Advanced Study Institute, Series E: Applied Sciences, Vol. 65. Martinus Nijhoff, Boston, MA, 1983.
-
(1983)
Progress in Nitrogen Ceramics
, vol.65
-
-
Riley, F.L.1
-
4
-
-
0004524545
-
High Temperature Structural Ceramics
-
R. N. Katz, "High Temperature Structural Ceramics," Science, 208, 841-47 (1980).
-
(1980)
Science
, vol.208
, pp. 841-847
-
-
Katz, R.N.1
-
5
-
-
0040490299
-
-
Brook Hill, Chestnut Hill, MA
-
J. J. Burke, E. M. Lenoe, and R. N. Katz (eds.), Ceramics for High Performance Applications II. Brook Hill, Chestnut Hill, MA, 1978.
-
(1978)
Ceramics for High Performance Applications II
-
-
Burke, J.J.1
Lenoe, E.M.2
Katz, R.N.3
-
6
-
-
0001251504
-
Silicon Nitride Ceramics: Composition, Fabrication Parameters, and Properties
-
J. Weiss, "Silicon Nitride Ceramics: Composition, Fabrication Parameters, and Properties," Annu. Rev. Mater. Sci., 11, 381-89 (1981).
-
(1981)
Annu. Rev. Mater. Sci.
, vol.11
, pp. 381-389
-
-
Weiss, J.1
-
7
-
-
0040114533
-
Engineering Properties of Nitrides
-
Edited by S. J. Schneider. ASM International, Metals Park, OH
-
S. Hampshire, "Engineering Properties of Nitrides"; pp. 812-20 in Engineered Materials Handbook, Ceramics and Glasses, Vol. 4. Edited by S. J. Schneider. ASM International, Metals Park, OH, 1991.
-
(1991)
Engineered Materials Handbook, Ceramics and Glasses
, vol.4
, pp. 812-820
-
-
Hampshire, S.1
-
9
-
-
0039896719
-
The Electronic Structure of Silicon Nitride, the Valence Band DOS and Band Gaps
-
J. P. Xanthakis, S. Papadopoulos, and P. R. Mason, "The Electronic Structure of Silicon Nitride, the Valence Band DOS and Band Gaps," J. Phys. C: Solid State Phys., 21, L555-L560 (1988).
-
(1988)
J. Phys. C: Solid State Phys.
, vol.21
-
-
Xanthakis, J.P.1
Papadopoulos, S.2
Mason, P.R.3
-
10
-
-
0001510994
-
Electronic Structure of Amorphous Hydrogenated Silicon Nitride and Amorphous Hydrogenated Germanium Nitride
-
S. S. Makler, G. Martins da Rocha, and E. V. Anda, "Electronic Structure of Amorphous Hydrogenated Silicon Nitride and Amorphous Hydrogenated Germanium Nitride," Phys. Rev. B: Condens. Matter, B41, 5857-70 (1990).
-
(1990)
Phys. Rev. B: Condens. Matter
, vol.B41
, pp. 5857-5870
-
-
Makler, S.S.1
Martins Da Rocha, G.2
Anda, E.V.3
-
11
-
-
0019050196
-
The Electronic Structure of Silicon Nitride
-
R. J. Sokel, "The Electronic Structure of Silicon Nitride," J. Phys. Chem. Solids, 41, 899-906 (1980).
-
(1980)
J. Phys. Chem. Solids
, vol.41
, pp. 899-906
-
-
Sokel, R.J.1
-
12
-
-
0019597526
-
The Electronic Properties of Silicon Nitride
-
J. Robertson, "The Electronic Properties of Silicon Nitride," Philos. Mag. B, B44, 215-37 (1981).
-
(1981)
Philos. Mag. B
, vol.B44
, pp. 215-237
-
-
Robertson, J.1
-
13
-
-
0001069311
-
Electronic Structures of β- and α-Silicon Nitride
-
S. Y. Ren and W. Y. Ching, "Electronic Structures of β- and α-Silicon Nitride," Phys. Rev. B: Condens. Matter, B23, 5454-63 (1981).
-
(1981)
Phys. Rev. B: Condens. Matter
, vol.B23
, pp. 5454-5463
-
-
Ren, S.Y.1
Ching, W.Y.2
-
14
-
-
0004644224
-
4
-
Materials Research Society Symposium Proceedings, Edited by G. Lucovsky and S. T. Pantelides. Materials Research Society, Pittsburgh, PA
-
2 and Its Interfaces. Edited by G. Lucovsky and S. T. Pantelides. Materials Research Society, Pittsburgh, PA, 1988.
-
(1988)
2 and Its Interfaces
, vol.105
, pp. 181-186
-
-
Xu, Y.N.1
Ching, W.Y.2
-
16
-
-
35949005389
-
Electronic Structure and Optical Properties of α and β Phases of Silicon Nitride, Silicon Oxynitride, and with Comparison to Silicon Dioxide
-
Y. N. Xu and W. Y. Ching, "Electronic Structure and Optical Properties of α and β Phases of Silicon Nitride, Silicon Oxynitride, and with Comparison to Silicon Dioxide," Phys. Rev. B: Condens. Matter, B51, 17379-89 (1995).
-
(1995)
Phys. Rev. B: Condens. Matter
, vol.B51
, pp. 17379-17389
-
-
Xu, Y.N.1
Ching, W.Y.2
-
17
-
-
0025957694
-
Electronic Structure of Silicon Nitride
-
J. Robertson, "Electronic Structure of Silicon Nitride," Philos. Mag. B, B63, 47-77 (1991).
-
(1991)
Philos. Mag. B
, vol.B63
, pp. 47-77
-
-
Robertson, J.1
-
20
-
-
0038477918
-
Hole Conduction and Valence-Bond Structure of Silicon Nitride Films on Silicon
-
Z. A. Weinberg and R. A. Pollak, "Hole Conduction and Valence-Bond Structure of Silicon Nitride Films on Silicon," Appl. Phys. Lett., 27 [4] 254-55 (1975).
-
(1975)
Appl. Phys. Lett.
, vol.27
, Issue.4
, pp. 254-255
-
-
Weinberg, Z.A.1
Pollak, R.A.2
-
22
-
-
0029322818
-
Crystal Orbital Schemes for Solids. Transition Metal Monocarbides and Mononitrides
-
L'. Benco, "Crystal Orbital Schemes for Solids. Transition Metal Monocarbides and Mononitrides," Solid State Commun., 94, 861-66 (1995).
-
(1995)
Solid State Commun.
, vol.94
, pp. 861-866
-
-
Benco, L.1
-
24
-
-
0026910780
-
Electronic Structure behind the Mechanical Properties of β-sialons
-
I. Tanaka, S. Nasu, H. Adachi, Y. Miyamoto, and K. Niihara, "Electronic Structure behind the Mechanical Properties of β-sialons," Acta Metall. Mater., 40, 1995-2001 (1992).
-
(1992)
Acta Metall. Mater.
, vol.40
, pp. 1995-2001
-
-
Tanaka, I.1
Nasu, S.2
Adachi, H.3
Miyamoto, Y.4
Niihara, K.5
-
26
-
-
0029291357
-
4
-
4," Surf. Sci., 327, 274-84 (1995).
-
(1995)
Surf. Sci.
, vol.327
, pp. 274-284
-
-
Benco, L.1
-
31
-
-
0022012906
-
Ruby Structures Peculiarities Derived from X-Ray Diffraction Data Localization of Chromium Atoms
-
(a)V. G. Tsirelson, M. Y. Antipin, R. G. Gerr, R. P. Ozerov, and Y. T. Struchkov, "Ruby Structures Peculiarities Derived from X-Ray Diffraction Data Localization of Chromium Atoms," Phys. Status Solidi A, A87, 425-33 (1985).
-
(1985)
Phys. Status Solidi A
, vol.A87
, pp. 425-433
-
-
Tsirelson, V.G.1
Antipin, M.Y.2
Gerr, R.G.3
Ozerov, R.P.4
Struchkov, Y.T.5
-
32
-
-
0742282141
-
Structures and Transformation Mechanism of the η, γ and θ Transition Aluminas
-
(b)R. S. Zhou and R. L. Snyder, "Structures and Transformation Mechanism of the η, γ and θ Transition Aluminas," Acta Crystallogr., Sect. B: Struct. Crystallogr. Cryst. Chem., B47, 617-30 (1991).
-
(1991)
Acta Crystallogr., Sect. B: Struct. Crystallogr. Cryst. Chem.
, vol.B47
, pp. 617-630
-
-
Zhou, R.S.1
Snyder, R.L.2
-
33
-
-
0017536236
-
Crystal Structure Refinement of Al and GaN
-
(c)H. Schulz and K. H. Thiemann, "Crystal Structure Refinement of Al and GaN," Solid State Commun., 23, 815-19 (1977).
-
(1977)
Solid State Commun.
, vol.23
, pp. 815-819
-
-
Schulz, H.1
Thiemann, K.H.2
-
34
-
-
35949006090
-
Zinc-Blende Wurzite Polytypism in Semiconductors
-
(d)C. Y. Yeh, Z. W. Lu, S. Froyen, and A. Zunger, "Zinc-Blende Wurzite Polytypism in Semiconductors," Phys. Rev. B: Condens. Matter, B46, 10086-97 (1992).
-
(1992)
Phys. Rev. B: Condens. Matter
, vol.B46
, pp. 10086-10097
-
-
Yeh, C.Y.1
Lu, Z.W.2
Froyen, S.3
Zunger, A.4
-
35
-
-
33749005863
-
A Chemical and Theoretical Way to Look at Bonding on Surfaces
-
R. Hoffmann, "A Chemical and Theoretical Way to Look at Bonding on Surfaces," Rev. Mod. Phys., 60, 601-28 (1988).
-
(1988)
Rev. Mod. Phys.
, vol.60
, pp. 601-628
-
-
Hoffmann, R.1
-
36
-
-
11744375781
-
-
QCPE Program No. 571. Indiana University, Bloomington, IN
-
M. H. Whangbo, M. Evain, T. Hungbanks, M. Kertesz, S. D. Wijeyesekera, C. Wilker, C. Zheng, and R. Hoffmann, Extended Hückel Molecular and Crystal Calculator, QCPE Program No. 571. Indiana University, Bloomington, IN, 1988.
-
(1988)
Extended Hückel Molecular and Crystal Calculator
-
-
Whangbo, M.H.1
Evain, M.2
Hungbanks, T.3
Kertesz, M.4
Wijeyesekera, S.D.5
Wilker, C.6
Zheng, C.7
Hoffmann, R.8
-
37
-
-
0346927956
-
An Extended Hückel Theory. I. Hydrocarbons
-
R. Hoffmann, "An Extended Hückel Theory. I. Hydrocarbons," J. Chem. Phys., 39, 1397-412 (1963).
-
(1963)
J. Chem. Phys.
, vol.39
, pp. 1397-1412
-
-
Hoffmann, R.1
-
38
-
-
33746322170
-
Atomic Shielding Parameters
-
G. Burns, "Atomic Shielding Parameters," J. Chem. Phys., 41, 1521-22 (1964).
-
(1964)
J. Chem. Phys.
, vol.41
, pp. 1521-1522
-
-
Burns, G.1
-
40
-
-
33947092746
-
Counterintuitive Orbital Mixing in Semiempirical and ab initio Molecular Orbital Calculations
-
J. H. Ammeter, H.-B. Bürgi, J. C. Thibeault, and R. Hoffmann, "Counterintuitive Orbital Mixing in Semiempirical and ab initio Molecular Orbital Calculations," J. Am. Chem. Soc., 100, 3686-92 (1978).
-
(1978)
J. Am. Chem. Soc.
, vol.100
, pp. 3686-3692
-
-
Ammeter, J.H.1
Bürgi, H.-B.2
Thibeault, J.C.3
Hoffmann, R.4
-
43
-
-
84990678028
-
The Use of Symmetry in Reciprocal Space Integrations. Asymmetric Units and Weighting Factors for Numerical Intergration Procedures in Any Crystal Symmetry
-
R. Ramirez and M. C. Böhm, "The Use of Symmetry in Reciprocal Space Integrations. Asymmetric Units and Weighting Factors for Numerical Intergration Procedures in Any Crystal Symmetry," Int. J. Quantum Chem., 34, 571-94 (1988).
-
(1988)
Int. J. Quantum Chem.
, vol.34
, pp. 571-594
-
-
Ramirez, R.1
Böhm, M.C.2
-
45
-
-
85047675789
-
Strength and Oxidation of Reaction-Sintered Silicon Nitride
-
A. G. Evans and R. W. Davidge, "Strength and Oxidation of Reaction-Sintered Silicon Nitride," J. Mater. Sci., 5, 314-25 (1970).
-
(1970)
J. Mater. Sci.
, vol.5
, pp. 314-325
-
-
Evans, A.G.1
Davidge, R.W.2
-
46
-
-
84977250329
-
Oxidation Kinetics of Powdered Silicon Nitride
-
R. M. Horton, "Oxidation Kinetics of Powdered Silicon Nitride," J. Am. Ceram. Soc., 52 [3] 121-24 (1969).
-
(1969)
J. Am. Ceram. Soc.
, vol.52
, Issue.3
, pp. 121-124
-
-
Horton, R.M.1
-
47
-
-
0024478566
-
Interfacial Characterization of Silicon Nitride Powders
-
L. Bergström and R. J. Pugh, "Interfacial Characterization of Silicon Nitride Powders," J. Am. Ceram. Soc., 72 [1] 103-109 (1989).
-
(1989)
J. Am. Ceram. Soc.
, vol.72
, Issue.1
, pp. 103-109
-
-
Bergström, L.1
Pugh, R.J.2
-
48
-
-
0007507455
-
The Theory of Metal-Ceramic Interfaces
-
M. W. Finnis, "The Theory of Metal-Ceramic Interfaces," J. Phys.: Condens. Matter, 8, 5811-36 (1996).
-
(1996)
J. Phys.: Condens. Matter
, vol.8
, pp. 5811-5836
-
-
Finnis, M.W.1
|