Model experiment on thermodynamic stability of retained intergranular amorphous films

Journal of the American Ceramic Society

Volumn 80, Issue 7, 1997, Pages 1893-1896

  Acker, Harold D ^a,b,c   Chiang, Yet Ming ^a,b  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b AMERICAN CERAMIC SOCIETY   (United States)

^c NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; INTERFACES (MATERIALS); MATERIALS TESTING; MODELS; QUENCHING; RESIDUAL STRESSES; SILICA; SINGLE CRYSTALS; SUBSTRATES; THERMODYNAMIC STABILITY; TITANIUM DIOXIDE;

CAPILLARY EFFECT; EUTECTIC LIQUID; EUTECTIC TEMPERATURE; INTERGRANULAR AMORPHOUS FILM; THIN SILICA FILM;

AMORPHOUS FILMS;

EID: 0031186172     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1997.tb03068.x     Document Type: Article

References (26)

1. P. Drew and M. H. Lewis, "The Microstructures of Silicon Nitride Ceramics during Hot-Pressing Transformations," J. Mater. Sci., 9, 261-69 (1974).
2. B. D. Powell and P. Drew, "The Identification of a Grain-Boundary Phase in Hot-Pressed Silicon Nitride by Auger Electron Spectroscopy," J. Mater. Sci., 9, 1867-70 (1974).
3. A. G. Evans and S. M. Wiederhorn, "Crack Propagation and Failure Prediction in Silicon Nitride at Elevated Temperatures," J. Mater. Sci., 9, 270-78 (1974).
4. 4," J. Mater. Sci., 10, 983-97 (1975).
5. M. Cinibulk, G. Thomas, and S. Johnson, "Grain-Boundary Phase Crystallization and Strength of Silicon Nitride Sintered with a YSiAlON Glass," J. Am. Ceram. Soc., 73 [6] 1606-12 (1990).
6. R. Raj, "Fundamental Research in Structural Ceramics for Service near 2000°C," J. Am. Ceram. Soc., 76 [9] 2147-74 (1993).
7. D. A. Bonnell, T-Y. Tien, and M. Rühle, "Controlled Crystallization of the Amorphous Phase in Silicon Nitride Ceramics," J. Am. Ceram. Soc., 70 [7] 460-65 (1987).
8. M. M. Chadwick and D. S. Wilkinson, "Microstructural Evolution in Annealed and Crept Silicon Nitride," J. Am. Ceram. Soc., 76 [2] 376-84 (1993).
9. S. P. S. Badwal and J. Drennan, "Yttria-Zirconia: Effect of Microstructure on Conductivity," J. Mater. Sci., 22, 3231-38 (1987).
10. Y.-M. Chiang, L. A. Silverman, R. H. French, and R. M. Cannon, "The Thin Glass Film between Nanocrystalline Conductor Particles in Thick Film Resistors," J. Am. Ceram. Soc., 77 [5] 1143-52 (1994).
11. D. R. Clarke, "The Microstructural Location of the Intergranular Metal Oxide Phase in a Zinc Oxide Varistor," J. Appl. Phys., 49 [4] 2407 (1989).
12. E. Olsson and G. L. Dunlop, "Characterization of Individual Interfacial Barriers in a ZnO Varistor Material," J. Appl. Phys., 66 [8] 3666-75 (1989).
13. H. Wang and Y.-M. Chiang, "Thermodynamic Stability of Intergranular Amorphous Films in Bi-Doped ZnO," J. Am. Ceram. Soc., in press.
14. 3-Doped ZnO"; in Ceramic Microstructures '96. Edited by A. P. Tomsia and A. M. Glaeser. Plenum Press, New York, in press.
15. 3-Fluxed Sintered Silicon Nitride, Part 1. Microstructure Characterization," J. Mater. Sci., 28, 3529-38 (1993).
16. H.-J. Kleebe, M. J. Hoffmann, and M. Rühle, "Influence of Secondary Phase Chemistry on Grain Boundary Film Thickness in Silicon Nitride," Z. Metallkd., 83 [8] 610-17 (1992).
17. J. P. Gambino, W. D. Kingery, G. E. Pike, and H. R. Phillip, "Effect of Heat Treatments on the Wetting Behavior of Bismuth Rich Intergranular Phases in ZnO:Bi:Co Varistors," J. Am. Ceram. Soc., 72 [4] 642-45 (1989).
18. 4 Ceramics. Edited by M. J. Hoffmann and G. Petzow. Kluwer Academic Publishers, Boston, MA, 1994.
19. R. Raj, "Morphology and Stability of the Glass Phase in Glass-Ceramic Systems," J. Am. Ceram. Soc., 64 [5] 245-48 (1981).
20. R. Raj and F. F. Lange, "Crystallization of Small Quantities of Glass (or a Liquid) Segregated in Grain Boundaries," Acta Metall. 29, 1993-2000 (1981).
21. H. Kessler, H.-J. Kleebe, R. M. Cannon, and W. Pompe, "Influence of Internal Stresses on Crystallization of Intergranular Phases in Ceramics," Acta Metall. Mater., 40 [9] 2233-45 (1992).
22. D. R. Clarke, "On the Equilibrium Thickness of Intergranular Glass Phases in Ceramic Materials," J. Am. Ceram. Soc., 70 [1] 15-22 (1987).
23. H. D. Ackler, "Thermodynamic Calculations and Model Experiments on Thin Intergranular Amorphous Films in Ceramics"; Ph.D. Thesis. Massachusetts Institute of Technology, Cambridge, MA, February 1997.
24. H. D. Ackler and Y.-M. Chiang, "Thin Intergranular Films in Ceramics: Thermodynamic Calculations and Model Experiments in the System Titania-Silica"; in Ceramic Microstructures '96. Edited by A. P. Tomsia and A. M. Glaeser. Plenum Press, New York, in press.
25. R. C. DeVries, R. Roy, and E. F. Osborn, Trans. Br. Ceram. Soc., 53 [9] 531 (1954), as shown in: E. M. Levin, C. R. Robbins, and H. F. McMurdie; Fig. 113 in Phase Diagrams for Ceramists. Edited by M. K. Reser. American Ceramic Society, Columbus, OH, 1964.
26. R. C. DeVries, R. Roy, and E. F. Osborn, Trans. Br. Ceram. Soc., 53 [9] 531 (1954), as shown in: E. M. Levin, C. R. Robbins, and H. F. McMurdie; Fig. 113 in Phase Diagrams for Ceramists. Edited by M. K. Reser. American Ceramic Society, Columbus, OH, 1964.