Optimal experimental design for exit wave reconstruction from focal series in TEM

Ultramicroscopy

Volumn 64, Issue 1-4, 1996, Pages 137-152

  Buist, A H ^a,b   Van Den Bos, A ^a   Miedema, M A O ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; ELECTRON OPTICS; FOCUSING; IMAGE PROCESSING;

EXIT WAVE RECONSTRUCTION; FOCAL SERIES;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; ELECTRON MICROSCOPY; IMAGE RECONSTRUCTION;

EID: 0030221954     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00016-2     Document Type: Article

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