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Volumn 15, Issue 3, 1984, Pages 151-172

Improved high resolution image processing of bright field electron micrographs. I. Theory

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES, ELECTRON - IMAGING TECHNIQUES;

EID: 0021601720     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(84)90037-8     Document Type: Article
Times cited : (174)

References (66)
  • 9
    • 84978554484 scopus 로고
    • Principles of electron structure research at atomic resolution using conventional electron microscopes for the measurement of amplitudes and phases
    • (1970) Acta Crystallographica Section A , vol.26 A , pp. 414
    • Hoppe1
  • 18
    • 84913723422 scopus 로고    scopus 로고
    • O. Scherzer, in: Advances in Structure Research by Diffraction Methods, Vol. 7, Eds. W. Hoppe and R. Mason, p. 101.
  • 41
    • 84913732146 scopus 로고    scopus 로고
    • E.J. Kirkland, B.M. Siegel, N. Uyeda and Y. Fujiyoshi, Ultramicroscopy, to be submitted.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.