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Acta Materialia

Volumn 50, Issue 3, 2002, Pages 565-574

Imaging of the crystal structure of silicon nitride at 0.8 Ångström resolution

(3) Ziegler, A a Kisielowski, C b Ritchie, R O a

a UNIVERSITY OF CALIFORNIA (United States)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

Author keywords

Atomic resolution transmission electron microscopy; Ceramics; Crystal structure

Indexed keywords

CERAMIC MATERIALS; COMPUTER SIMULATION; CRYSTAL STRUCTURE; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);

SILICON NITRIDE;

EID: 0037039669 PISSN: 13596454 EISSN: None Source Type: Journal
DOI: 10.1016/S1359-6454(01)00363-9 Document Type: Article

Times cited : (31)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.