A comprehensive signature analysis scheme for oscillation-test

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 22, Issue 10, 2003, Pages 1409-1423

  Roh, Jeongjin ^a   Abraham, Jacob A ^b  

^a Hanyang University   (South Korea)

^b The University of Texas at Austin   (United States)

Author keywords

Built in self test (BIST); Design for test; Mixed signal test; Oscillation test; Signature analysis

Indexed keywords

CIRCUIT OSCILLATIONS; COMPARATOR CIRCUITS; DESIGN FOR TESTABILITY; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; LINEAR INTEGRATED CIRCUITS; MIXER CIRCUITS; TIME DIVISION MULTIPLEXING;

MIXED-SIGNAL TEST; OSCILLATION-TEST; SIGNATURE ANALYSIS;

BUILT-IN SELF TEST;

EID: 0142022779     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2003.818133     Document Type: Article

References (34)

1. M. F. Toner and G. W. Roberts, "A BIST scheme for an SNR test of a sigma-delta ADC," in Proc. IEEE Int. Test Conf., 1993, pp. 805-814.
2. B. Dufort and G. W. Roberts, "Signal generation using periodic single and multi bit sigma-delta modulated streams," in Proc. IEEE Int. Test Conf., 1997, pp. 396-405.
3. C. Y. Pan and K. T. Cheng, "Pseudorandom testing for mixed-signal circuits," IEEE Trans. Computer-Aided Design, vol. 16, pp. 1173-1185, Oct. 1997.
4. P. N. Variyam, A. Chatterjee, and N. Nagi, "Low-cost and efficient digital-compatible BIST for analog circuits pulse response sampling," in Proc. IEEE VLSI Test Symposium, 1997, pp. 261-266.
5. N. Nagi, A. Chatterjee, H. Yoon, and J. A. Abraham, "Signature analysis for analog and mixed-signal circuit test response compaction," IEEE Trans. Computer-Aided Design, vol. 17, pp. 540-546, June 1998.
6. J. Roh and J. A. Abraham, "Subband filtering scheme for analog and mixed-signal circuit testing," in Proc. IEEE Int. Test Conf., 1999, pp. 221-229.
7. W. M. Lindermeir, H. E. Graeb, and K. J. Antreich, "Analog testing by characteristic observation inference," IEEE Trans. Computer-Aided Design, vol. 18, pp. 1353-1368, Sept. 1999.
8. B. R. Epstein, M. Czigler, and S. R. Miller, "Fault detection and classification in linear integrated circuits: An application of discrimination analysis and hypothesis testing," IEEE Trans. Computer-Aided Design, vol. 12, pp. 102-113, Jan. 1993.
9. Z. Wang, G. Gielen, and W. Sansen, "Probabilistic fault detection and the selection of measurements for analog integrated circuits," IEEE Trans. Computer-Aided Design, vol. 17, pp. 862-872, Sept. 1998.
10. Z. R. Yang, M. Zwolinski, C. D. Chalk, and A. C. Williams, "Applying a robust heteroscedastic probabilistic neural network to analog fault detection and classification," IEEE Trans. Computer-Aided Design, vol. 19, pp. 142-151, Jan. 2000.
11. K. Arabi and B. Kaminska, "Testing analog and mixed-signal integrated circuits using oscillation-test method," IEEE Trans. Computer-Aided Design, vol. 16, pp. 745-753, July 1997.
12. ____, "Parametric and catastrophic fault coverage of analog circuits in oscillation-test methodology," in Proc. IEEE VLSI Test Symp., 1997 pp. 166-171.
13. ____, "Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits," in Proc. IEEE International Test Conf., 1997, pp. 786-795.
14. ____, "Built-in temperature sensors for on-line thermal monitoring of microelectronics structures," in Proc. IEEE Int. Conf. Computer Design, 1997, pp. 462-467.
15. ____, "Design for testability of embedded integrated operational amplifiers," IEEE J. Solid-State Circuits, vol. 33, pp. 573-581, Apr. 1998.
16. ____, "Oscillation-test methodology for low-cost testing of active analog filters," IEEE Trans. Instrumen. Meas., vol. 48, pp. 798-806, Aug. 1999.
17. I. H. S. Hassan, K. Arabi, and B. Kaminski, "Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation," in Proc. IEEE Int. Conf. Computer Design, 1998, pp. 40-46.
18. D. Vazquez, A. Rueda, J. L. Huertas, and E. Peralia, "A high-Q band-pass fully differential SC filter with enhanced testability," IEEE J. Solid-State Circuits, vol. 33, pp. 976-986, July 1998.
19. G. Huertas, D. Vazquez, A. Rueda, and J. L. Huertas, "Effective oscillation-based test for application to a DTMF filter bank," in Proc. IEEE Int. Test Conf., 1999, pp. 549-555.
20. M. S. Zarnik, F. Novak, and S. Macek, "Design of oscillation-based test structures for active RC filters," in IEEE Proc.-Circuits Devices Syst., vol. 147, 2000, pp. 297-302.
21. M. W.-T. Wong, "On the issues of oscillation test methodology," IEEE Trans. Instrum. Meas., vol. 49, pp. 240-245, Apr. 2000.
22. J. Roh and J. A. Abraham, "A comprehensive TDM comparator scheme for effective analysis of oscillation-based test," in Proc. IEEE VLSI Test Symp., Apr. 2000, pp. 143-148.
23. D. Vazquez, G. Huertas, G. Leger, A. Rueda, and J. L. Huertas, "Practical solutions for the application of the oscillation-based test: Start-up and on-chip evaluation," in Proc. IEEE VLSI Test Symp., Apr. 2002, pp. 143-148.
24. B. Razavi, Design of Analog CMOS Integrated Circuits. New York: McGraw-Hill, 2001.
25. K. K. Clarke and D. T. Hess, Communication Circuits: Analysis and Design. Reading, MA: Addison-Wesley, 1978.
26. L. O. Chua, C. A. Desoer, and E. S. Kuh, Linear and Nonlinear Circuits. New York: McGraw-Hill, 1987.
27. T. H. Lee, The Design of CMOS Radio-Frequency Integrated Circuits. Cambridge, U.K.: Cambridge Univ. Press, 1998.
28. A. Gelb and W. Vander Velde, Multiple-Input Describing Functions and Nonlinear System Design. New York: McGraw-Hill, 1968.
29. A. Rodriguez-Vazquez, B. Linares-Barranco, J. L. Huertas, and E. Sanchez-Sinencio, "On the design of voltage-controlled sinusoidal oscillatory using OTA's," IEEE Trans. Circuits Syst., vol. 37, pp. 198-211, Feb. 1990.
30. J.-J. E. Slotine and W. Li, Applied Nonlinear Control. Englewood Cliffs, NJ: Prentice-Hall, 1991.
31. Matlab Version 6.0, The MathWorks, Inc., 2000.
32. A. G. F. Dingwall, "Monolithic expandable 6 bit 20 MHz CMOS/SOS A/D converter," IEEE J. Solid-State Circuits, vol. SC-14, pp. 926-932, Dec. 1979.
33. B. Song and P. R. Gray, "A precision CMOS bandgap reference," IEEE J. Solid-State Circuits, vol. SC-18, pp. 634-643, Dec. 1983.
34. P. E. Allen and D. R. Holberg, CMOS Analog Circuit Design, 2nd ed. Oxford, U.K.: Oxford Univ. Press, 2002.