Testing analog and mixed-signal integrated circuits using oscillation-test method

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 16, Issue 7, 1997, Pages 745-753

  Arabi, Karim ^a,b   Kaminska, Bozena ^a,b  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

^b Opmaxx Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT OSCILLATIONS; LINEAR INTEGRATED CIRCUITS;

CIRCUIT UNDER TEST (CUT); MIXED SIGNAL INTEGRATED CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0031177505     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.644035     Document Type: Article

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