Probabilistic fault detection and the selection of measurements for analog integrated circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 17, Issue 9, 1998, Pages 862-872

  Wang, Zhihua ^a,b   Gielen, Georges ^a,b   Sansen, Willy ^a,b  

^a Katholieke Universiteit Leuven   (Belgium)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

Analog test; Test generation

Indexed keywords

ELECTRIC FAULT CURRENTS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING;

ANALOG INTEGRATED CIRCUITS; PROBABILISTIC FAULT DETECTION;

DESIGN FOR TESTABILITY;

EID: 0032165315     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.720321     Document Type: Article

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