Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 1998, Pages 40-44

  Ihs, Hassan ^a   Arabi, Karim ^a   Kaminska, Bozena ^a  

^a Opmaxx Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; DELTA SIGMA MODULATION; DIGITAL TO ANALOG CONVERSION; SPECIFICATIONS; STANDARDIZATION;

DIFFERENTIAL NONLINEARITY; INTEGRAL NONLINEARITY; OSCILLATION TEST STRATEGY;

BUILT-IN SELF TEST;

EID: 0032298334     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)