Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 786-795

  Arabi, Karim ^a   Kaminska, Bozena ^a  

^a Opmaxx Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CIRCUIT OSCILLATIONS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DIGITAL SIGNAL PROCESSING; LINEAR INTEGRATED CIRCUITS;

OSCILLATION BUILT IN SELF TEST (OBIST) SCHEME;

INTEGRATED CIRCUIT TESTING;

EID: 0031382121     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)