Oscillation-test methodology for low-cost testing of active analog filters

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 4, 1999, Pages 798-806

  Arabi, Karim ^a,b   Kaminska, Bozena ^a,c  

^a IEEE   (Canada)

^b ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

^c Opmaxx Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE ANALOG FILTERS; CIRCUIT UNDER TEST;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; BUILT-IN SELF TEST; CMOS INTEGRATED CIRCUITS; DESIGN FOR TESTABILITY; INTEGRATED CIRCUIT TESTING; MONTE CARLO METHODS; OSCILLATIONS;

ACTIVE FILTERS;

EID: 0033362293     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.779176     Document Type: Article

References (20)

1. K. Arabi, B. Kaminska, and J. Rzeszut, "BIST for digital-to-analog and analog-to-digital converters," IEEE Design Test Comput., vol. 13, no. 4, pp. 40-49, 1996.
2. M. J. Ohletz, "Hybrid built-in self-test (HBIST) structure for mixed analog/digital integrated circuits," 2nd Eur. Test Conf., 1991, pp. 307-316.
3. A. Chatterjee, K. Bruce, and N. Nagi, "DC built-in self-test of linear analog circuits using checksums," in VLSI Design Symp., Banglore, India, 1996.
4. M. Soma, "A design-for-test methodology for active analog filters," in IEEE Int. Test Conf., 1990, pp. 183-192.
5. J. L. Huertas, A. Rueda, and D. Vazquez, "Testable switched-capacitor filters," IEEE J. Solid-State Circuits, vol. 28, no. 7, 1993.
6. M. Jarwala and S.-J. Tsai, "A framework for design for testability of mixed analog/digital circuits," in IEEE Custom Integrated Circuit Conf., 1991, pp. 13.5.1-13.5.4.
7. P. P. Fasang, D. Mulins, and T. Wong, "Design for testability for mixed analog/digital ASICS," IEEE Custom Integrated Circuit Conf., 1988, pp. 16.5.1-16.5.4.
8. K. D. Wagner and T. W. Williams, "Design for testability of mixed signal integrated circuits," IEEE Int. Test Conf., 1988, pp. 823-829.
9. C.-L. Wey, "Built-in self-test structure for analog circuit fault diagnosis," IEEE Trans. Instrum. Meas., vol. 39, no. 3, pp. 517-521, 1990.
10. L. T. Wurtz, "Built-in self-test structure for mixed-mode circuits," IEEE Trans. Instrum. Meas., vol. 42, pp. 25-29, Feb. 1993.
11. K. Arabi and B. Kaminska, "Testing analog and mixed-signal integrated circuits using oscillation-test method," IEEE Trans. Computer-Aided Design, vol. 16, pp. 745-753, July 1997.
12. _, "Design for testability of embedded integrated operational amplifiers," IEEE J. Solid-State Circuits, vol. 33, pp. 573-581, Apr. 1998.
13. K. Arabi et al., "Dynamic digital integrated circuit testing using oscillation-test method," Electron. Lett., vol. 34, no. 8, pp. 762-763, 1998.
14. D. Vazquez, A. Rueda, and J. L. Huertas, "A low-cost strategy for testing analog filters," in IEEE Int. Symp. Circuits Systems, 1994, pp. 123-126.
15. K. K. Clarke and D. T. Hess, Communication Circuits: Analysis and Design. Reading, MA: Addison-Wesley, 1971, p. 658.
16. L. Milor and V. Visvanathan, "Detection of catastrophic faults in analog integrated circuits," IEEE Trans. Computer-Aided Design, vol. 8, pp. 114-130, Feb. 1989.
17. C. Stapper, F. Armstrong, and K. Saji, "Integrated circuit yield statistics," Proc. IEEE, vol. 71, pp. 453-470, 1983.
18. Q. F. Wilson and D. B. Day, "Practical automatic test program generation constraints," in Proc. Automatic Test Conf. Workshop, 1987.
19. P. Allen and D. R. Holberg, CMOS Analog Circuit Design. New York: Holt, Rineheart, and Winston, 1987.
20. F. Aubain, M. Slamani, and B. Kaminska, "BIOLINK: A new myoelectrical pointing device for interactive computer systems," IEEE EMBS Conf., 1991, pp. 1847-1848.