BIST scheme for an SNR test of a sigma-delta ADC

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 805-814

  Toner, M F ^a   Roberts, G W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; DIGITAL SIGNAL PROCESSING; INTEGRATED CIRCUIT TESTING; MONOLITHIC INTEGRATED CIRCUITS; SIGNAL TO NOISE RATIO;

MIXED ANALOG DIGITAL BUILT IN SELF TEST (MADBIST);

VLSI CIRCUITS;

EID: 0027834702     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)