A high-Q bandpass fully differential SC filter with enhanced testability

IEEE Journal of Solid-State Circuits

Volumn 33, Issue 7, 1998, Pages 976-986

  Vázquez, Diego ^b,c   Rueda, Adoración ^a,b,c,d   Huertas, José Luis ^a,b,c,e   Peralías, Eduardo ^b,c  

^a IEEE

^b UNIVERSITY OF SEVILLE   (Spain)

^c INSTITUTO DE MICROELECTRÓNICA DE SEVILLA   (Spain)

^d National Microelectronics Center

^e PHILIPS HEALTHCARE   (United States)

Author keywords

Design for testability; Off and on line testing; SC filters

Indexed keywords

BANDPASS FILTERS; CAPACITORS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING;

BUILT IN SELF TEST (BIST); SWITCHED CAPACITORS (SC);

SWITCHED FILTERS;

EID: 0032124139     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.701236     Document Type: Article

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