Practical solutions for the application of the oscillation-based-test: Start-up and on-chip evaluation

Proceedings of the IEEE VLSI Test Symposium

Volumn 2002-January, Issue , 2002, Pages 433-438

  Vazquez D ^a   Huertas, G ^a   Leger, G ^a   Rueda, A ^a   Huertas, J L ^a  

^a UNIVERSITY OF SEVILLE   (Spain)

Author keywords

Built in self test; Circuit faults; Circuit testing; Distortion measurement; Frequency measurement; Oscillators; Pins; Prototypes; Robustness; Signal generators

Indexed keywords

INTEGRATED CIRCUIT TESTING; OSCILLATORS (ELECTRONIC); ROBUSTNESS (CONTROL SYSTEMS); SIGNAL GENERATORS; VLSI CIRCUITS;

CIRCUIT FAULTS; CIRCUIT TESTING; DISTORTION MEASUREMENT; FREQUENCY MEASUREMENTS; PINS; PROTOTYPES;

BUILT-IN SELF TEST;

EID: 18144380988     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2002.1011176     Document Type: Conference Paper

References (11)

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