Formation of organic monolayer on a hydrogen terminated Si(111) surface via Silicon-Carbon bond monitored by ATR FT-IR and SFG spectroscopy: Effect of orientational order on the reaction rate

Chemistry Letters

Volumn , Issue 2, 2002, Pages 208-209

  Quayum, M Emran ^a   Kondo, Toshihiro ^a   Nihonyanagi, Satoshi ^a   Miyamoto, Dai ^a   Uosaki, Kohei ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; HYDROGEN; SILICON;

ANALYTIC METHOD; ARTICLE; ATTENUATED TOTAL REFLECTANCE FOURIER TRANSFORM INFRARED SPECTROSCOPY; CALCULATION; CHEMICAL BOND; CHEMICAL REACTION KINETICS; CONFORMATION; COVALENT BOND; DEVICE; ELLIPSOMETRY; SUM FREQUENCY GENERATION SPECTROSCOPY; THICKNESS; VIBRATION;

EID: 0036003147     PISSN: 03667022     EISSN: None     Source Type: Journal    
DOI: 10.1246/cl.2002.208     Document Type: Article

References (23)