-
1
-
-
0026140814
-
Ion bombardment of x-ray multilayer coatings: Comparison of ion etching and ion assisted deposition
-
E. J. Puik, M. J. van der Wiel, H. Zeijlemaker, and J. Verho-even, “Ion bombardment of x-ray multilayer coatings: comparison of ion etching and ion assisted deposition,” Appl. Surf. Sci. 47, 251-260 (1991).
-
(1991)
Appl. Surf. Sci
, vol.47
, pp. 251-260
-
-
Puik, E.J.1
Van Der Wiel, M.J.2
Zeijlemaker, H.3
Verho-Even, J.4
-
2
-
-
0000841628
-
Enhancement of the reflectivity of multilayer x-ray mirrors by ion polishing
-
E. Spiller, “Enhancement of the reflectivity of multilayer x-ray mirrors by ion polishing,” Opt. Eng. 29, 609-613 (1990).
-
(1990)
Opt. Eng.
, vol.29
, pp. 609-613
-
-
Spiller, E.1
-
3
-
-
0033683095
-
Progress in Mo/Si multilayer coating technology for EUVL optics
-
E. A. Dobisc, ed., Proc. SPIE
-
E. Louis, A. E. Yakshin, P. C. Goerts, S. Oestreich, R. Stuik, E. L. Maas, M. J. Kessels, F. Bijkerk, M. Haidl, S. Muellender, M. Mertin, D. S. Schmitz, F. Frank, and G. Ulm, “Progress in Mo/Si multilayer coating technology for EUVL optics,” in Emerging Lithographic Technologies IV, E. A. Dobisc, ed., Proc. SPIE 3997, 406-411 (2000).
-
(2000)
Emerging Lithographic Technologies IV
, vol.3997
, pp. 406-411
-
-
Louis, E.1
Yakshin, A.E.2
Goerts, P.C.3
Oestreich, S.4
Stuik, R.5
Maas, E.L.6
Kessels, M.J.7
Bijkerk, F.8
Haidl, M.9
Muellender, S.10
Mertin, M.11
Schmitz, D.S.12
Frank, F.13
Ulm, G.14
-
4
-
-
0039574854
-
Electrom-beam deposited Mo/S multilayer x-ray mirrors and gratings
-
B. Schmiedekamp, A. Kloidt, H. J. Stock, U. Kleineberg, T. Dohring, M. Propper, S. Rahn, K. Higers, B. Heidemann, T. Tappe, U. Heinzmann, M. K. Krumrey, P. Müller, F. Scholze, and K. F. Heidemann, “Electrom-beam deposited Mo/S multilayer x-ray mirrors and gratings,” Opt. Eng. 33, 1314-1321 (1994).
-
(1994)
Opt. Eng.
, vol.33
, pp. 1314-1321
-
-
Schmiedekamp, B.1
Kloidt, A.2
Stock, H.J.3
Kleineberg, U.4
Dohring, T.5
Propper, M.6
Rahn, S.7
Higers, K.8
Heidemann, B.9
Tappe, T.10
Heinzmann, U.11
Krumrey, M.K.12
Müller, P.13
Scholze, F.14
Heidemann, K.F.15
-
5
-
-
84975635029
-
Molybdenum-silicon multilayer mirrors for the extreme ultraviolet
-
T. W. Barbee, Jr., S. Mrowka, and M. C. Hettrick, “Molybdenum-silicon multilayer mirrors for the extreme ultraviolet,” Appl. Opt. 24, 883-886 (1985).
-
(1985)
Appl. Opt
, vol.24
, pp. 883-886
-
-
Barbee, T.W.1
Mrowka, S.2
Hettric, M.C.3
-
6
-
-
0036671788
-
Improved reflectance and stability of Mo/Si multilayers
-
S. Bajt, J. Alameda, T. Barbee, Jr., W. M. Clift, J. A. Folta, B. Kaufmann, and E. Spiller, “Improved reflectance and stability of Mo/Si multilayers,” Opt. Eng. 41, 1797-1804 (2002).
-
(2002)
Opt. Eng
, vol.41
, pp. 1797-1804
-
-
Bajt, S.1
Alameda, J.2
Barbee, T.3
Clift, W.M.4
Folta, J.A.5
Kaufmann, B.6
Spiller, E.7
-
7
-
-
0035767161
-
Damage resistant and low-stress Si-based multilayer mirrors
-
D. Tichenor and J. Folta, eds., Proc. SPIE
-
T. Feigl, S. A. Yulin, T. Kuhlmann, and N. Kaiser, “Damage resistant and low-stress Si-based multilayer mirrors,” in Soft X-Ray and EUVImaging Systems II, D. Tichenor and J. Folta, eds., Proc. SPIE 4506, 121-126 (2001).
-
(2001)
Soft X-Ray and Euvimaging Systems II
, vol.4506
, pp. 121-126
-
-
Feigl, T.1
Yulin, S.A.2
Kuhlmann, T.3
Kaiser, N.4
-
8
-
-
0035450910
-
Mo/Si-multilayers for EUV applications prepared by pulsed laser deposition (PLD)
-
S. Braun, R. Dietsch, M. Haidl, T. Holz, H. Mai, S. Mullender, and R. Scholz, “Mo/Si-multilayers for EUV applications prepared by pulsed laser deposition (PLD),” Microelectron. Eng. 57-58, 9-15 (2001).
-
(2001)
Microelectron. Eng.
, vol.57-58
, pp. 9-15
-
-
Braun, S.1
Dietsch, R.2
Haidl, M.3
Holz, T.4
Mai, H.5
Mullender, S.6
Scholz, R.7
-
9
-
-
0000522975
-
Mask blanks for extreme ultraviolet lithography: Ion beam sputter deposition of low defect density Mo/Si multilayers
-
P. A. Kearney, C. E. Moore, S. I. Tan, S. P. Vernon, and R. A. Levesque, “Mask blanks for extreme ultraviolet lithography: ion beam sputter deposition of low defect density Mo/Si multilayers,” J. Vac. Sci. Technol. B 15, 2452-2454 (1997).
-
(1997)
J. Vac. Sci. Technol. B
, vol.15
, pp. 2452-2454
-
-
Kearney, P.A.1
Moore, C.E.2
Tan, S.I.3
Vernon, S.P.4
Levesque, R.A.5
-
10
-
-
0036614411
-
Mo/Si multilayers with different barrier layers for applications as extreme ultraviolet mirror
-
S. Braun, H. Mai, M. Moss, R. Scholz, and A. Leson, “Mo/Si multilayers with different barrier layers for applications as extreme ultraviolet mirror,” Jpn. J. Appl. Phys. Part 1 41, 4074-4081 (2001).
-
(2001)
Jpn. J. Appl. Phys.
, vol.41
, pp. 4074-4081
-
-
Braun, S.1
Mai, H.2
Moss, M.3
Scholz, R.4
Leson, A.5
-
11
-
-
0027592958
-
Smoothing of interfaces in ultrathin Mo/Si multilayers by ion-bombardment
-
A. Kloidt, H. J. Stock, U. Kleineberg, T. Dohring, M. Propper, B. Schmiedeskamp, and U. Heinzmann, “Smoothing of interfaces in ultrathin Mo/Si multilayers by ion-bombardment,” Thin Solid Films 228, 154-157 (1993).
-
(1993)
Thin Solid Films
, vol.228
, pp. 154-157
-
-
Kloidt, A.1
Stock, H.J.2
Kleineberg, U.3
Dohring, T.4
Propper, M.5
Schmiedeskamp, B.6
Heinzmann, U.7
-
12
-
-
0036865153
-
Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition
-
F. Eriksson, G. A. Johansson, H. M. Hertz, and J. Birch, “Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition,” Opt. Eng. 41, 2903-2909 (2002).
-
(2002)
Opt. Eng.
, vol.41
, pp. 2903-2909
-
-
Eriksson, F.1
Johansson, G.A.2
Hertz, H.M.3
Birch, J.4
-
13
-
-
0036643632
-
Characterization of optics and masks for the EUV lithography
-
V. Paret, P. Boher, R. Geyl, B. Vidal, M. Putero-Vuaroqueaux, E. Quesnel, and J. Robic, “Characterization of optics and masks for the EUV lithography,” Microelectron. Eng. 61-62, 145-155 (2002).
-
(2002)
Microelectron. Eng.
, vol.61-62
, pp. 145-155
-
-
Paret, V.1
Boher, P.2
Geyl, R.3
Vidal, B.4
Putero-Vuaroqueaux, M.5
Quesnel, E.6
Robic, J.7
-
14
-
-
0035683292
-
An ion-assisted Mo-Si deposition process for planarizing reticle substrates for extreme ultraviolet lithography
-
P. B. Mirkarimi, E. A. Spiller, D. G. Stearns, V. Sperry, and S. L. Baker, “An ion-assisted Mo-Si deposition process for planarizing reticle substrates for extreme ultraviolet lithography,” IEEE J. Quantum Electron. 37, 1514-1516 (2001).
-
(2001)
IEEE J. Quantum Electron.
, vol.37
, pp. 1514-1516
-
-
Mirkarimi, P.B.1
Spiller, E.A.2
Stearns, D.G.3
Sperry, V.4
Baker, S.L.5
-
15
-
-
0022955585
-
Statistical and signal processing concepts in surface metrology
-
G. M. Sanger, ed., Proc. SPIE
-
E. L. Church and P. Z. Takacs, “Statistical and signal processing concepts in surface metrology,” in Optical Manufacturing Testing and Aspheric Optics, G. M. Sanger, ed., Proc. SPIE 645, 107-115 (1986).
-
(1986)
Optical Manufacturing Testing and Aspheric Optics
, vol.645
, pp. 107-115
-
-
Church, E.L.1
Takacs, P.Z.2
-
16
-
-
0000300995
-
A stochastic model for thin film growth and erosion
-
D. G. Stearns, “A stochastic model for thin film growth and erosion,” Appl. Phys. Lett. 62, 1745-1747 (1993).
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 1745-1747
-
-
Stearns, D.G.1
-
17
-
-
56249127529
-
Nonspecular x-ray scattering in a multilayer-coated imaging system
-
D. G. Stearns, D. P. Gaines, D. W. Sweeney, and E. M. Gul-likson, “Nonspecular x-ray scattering in a multilayer-coated imaging system,” J. Appl. Phys. 84, 1003-1028 (1998).
-
(1998)
J. Appl. Phys.
, vol.84
, pp. 1003-1028
-
-
Stearns, D.G.1
Gaines, D.P.2
Sweeney, D.W.3
Gul-Likson, E.M.4
-
18
-
-
0033750571
-
Nonspecular scattering from extreme ultraviolet multilayer coatings
-
D. G. Stearns and E. M. Gullikson, “Nonspecular scattering from extreme ultraviolet multilayer coatings,” Physica B 283, 84-91 (2000).
-
(2000)
Physica B
, vol.283
, pp. 84-91
-
-
Stearns, D.G.1
Gullikson, E.M.2
-
19
-
-
0042407342
-
Kinetics of surface growth: Phenomenology, scaling, and mechanisms of smoothening and roughening
-
W. M. Tong and R. S. Williams, “Kinetics of surface growth: phenomenology, scaling, and mechanisms of smoothening and roughening,” Annu. Rev. Phys. Chem. 45, 401-438 (1994).
-
(1994)
Annu. Rev. Phys. Chem.
, vol.45
, pp. 401-438
-
-
Tong, W.M.1
Williams, R.S.2
-
20
-
-
0031305908
-
Nonspecular scattering from multilayer mirrors at normal incidence
-
R. B. Hoover and A. B. Walker, eds., Proc. SPIE
-
E. M. Gullikson, D. G. Stearns, D. P. Gaines, and J. H. Underwood, “Nonspecular scattering from multilayer mirrors at normal incidence,” in Grazing Incidence and Multilayer X-Ray Optical Systems, R. B. Hoover and A. B. Walker, eds., Proc. SPIE 3113, 412-419 (1997).
-
(1997)
Grazing Incidence and Multilayer X-Ray Optical Systems
, vol.3113
, pp. 412-419
-
-
Gullikson, E.M.1
Stearns, D.G.2
Gaines, D.P.3
Underwood, J.H.4
-
21
-
-
0033358379
-
Smoothing of mirror substrates by thin film deposition
-
C. A. McDonald, K. A. Goldberg, J. R. Maldonado, H. H. Chen-Mayer, and S. P. Vernon, eds., Proc. SPIE
-
E. Spiller, S. Baker, E. Parra, and C. Tarrio, “Smoothing of mirror substrates by thin film deposition,” in EUV, X-Ray, and Neutron Optics and Sources, C. A. McDonald, K. A. Goldberg, J. R. Maldonado, H. H. Chen-Mayer, and S. P. Vernon, eds., Proc. SPIE 3767, 143-153 (1999).
-
(1999)
EUV, X-Ray, and Neutron Optics and Source
, vol.3767
, pp. 143-153
-
-
Spiller, E.1
Baker, S.2
Parra, E.3
Tarrio, C.4
-
22
-
-
85010106468
-
-
Terminal Drive, Plainview, N.Y. 11801
-
Veeco Instruments, Inc., Terminal Drive, Plainview, N.Y. 11801.
-
-
-
-
23
-
-
0000022036
-
High-resolution, high-flux, user friendly VLS beamline at the ALS for the 50-1300 eV energy region
-
J. H. Underwood and E. M. Gullikson, “High-resolution, high-flux, user friendly VLS beamline at the ALS for the 50-1300 eV energy region,” J. Electron Spectrosc. Relat. Phenom. 92, 265-272 (1998).
-
(1998)
J. Electron Spectrosc. Relat. Phenom.
, vol.92
, pp. 265-272
-
-
Underwood, J.H.1
Gullikson, E.M.2
-
24
-
-
0034768492
-
Recent developments in EUV reflectometry at the advanced light source
-
E. A. Dobisz, ed., Proc. SPIE
-
E. M. Gullikson, S. Mrowka, and B. B. Kaufmann, “Recent developments in EUV reflectometry at the advanced light source,” in Emerging Lithographic Technologies V, E. A. Dobisz, ed., Proc. SPIE 4343, 363-373 (2001).
-
(2001)
Emerging Lithographic Technologies V
, vol.4343
, pp. 363-373
-
-
Gullikson, E.M.1
Mrowka, S.2
Kaufmann, B.B.3
-
25
-
-
85010097789
-
-
presented at the 1st International EUV Lithography Symposium, Dallas, Texas, 14-15 October2002, available
-
E. M. Gullikson, J. Taylor, K. Blaedel, S. Baker, and C. Larson, “EUV scattering from mask substrate roughness,” presented at the 1st International EUV Lithography Symposium, Dallas, Texas, 14-15 October2002, available athttp://www.sematech. org/public/resources/litho/euvl/meetings.htm.
-
EUV Scattering from Mask Substrate Roughness
-
-
Gullikson, E.M.1
Taylor, J.2
Blaedel, K.3
Baker, S.4
Larson, C.5
-
26
-
-
85010097779
-
-
112 Robin Hill Road, Santa Barbara, Calif. 93117
-
Digital Instruments, 112 Robin Hill Road, Santa Barbara, Calif. 93117.
-
-
-
-
27
-
-
0027842568
-
Silicide layer growth rates in Mo/Si multilayers
-
R. S. Rosen, D. G. Stearns, M. A. Viliardos, M. E. Kasner, S. P. Vernon, and Y. Cheng, “Silicide layer growth rates in Mo/Si multilayers,” Appl. Opt. 32, 6975-6980 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 6975-6980
-
-
Rosen, R.S.1
Stearns, D.G.2
Viliardos, M.A.3
Kasner, M.E.4
Vernon, S.P.5
Cheng, Y.6
-
28
-
-
0004932883
-
X-ray interactions: Photoabsorption, scattering, transmission, and reflection at E = 50-30 000 eV, Z = 1-92
-
B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E = 50-30 000 eV, Z = 1-92,” At. Data Nucl. Data Tables 54, 181-424 (1993); updated at http://www-cxro. lbl.gov/optical_constants.
-
(1993)
At. Data Nucl. Data Tables
, vol.54
, pp. 181-424
-
-
Henke, B.L.1
Gullikson, E.M.2
Davis, J.C.3
-
29
-
-
85010138603
-
-
5150 Shadow Estate, San Jose, Calif. 95135
-
Thin Film Analysys, Inc., 5150 Shadow Estate, San Jose, Calif. 95135.
-
-
-
-
30
-
-
0001662271
-
Mo/Si and Mo/Be multilayer thin films on Zerodur substrates for extreme-ultraviolet lithography
-
P. B. Mirkarimi, S. Bajt, and M. A. Wall, “Mo/Si and Mo/Be multilayer thin films on Zerodur substrates for extreme-ultraviolet lithography,” Appl. Opt. 39, 1617-1625 (2000).
-
(2000)
Appl. Opt.
, vol.39
, pp. 1617-1625
-
-
Mirkarimi, P.B.1
Bajt, S.2
Wall, M.A.3
-
31
-
-
0035893104
-
Fabrication of high-efficiency multilayer-coated binary blazed gratings in the EUV regime
-
P. P. Naulleau, E. H. Anderson, E. M. Gullikson, and J. Bokor, “Fabrication of high-efficiency multilayer-coated binary blazed gratings in the EUV regime,” Opt. Commun. 200, 27-34 (2001).
-
(2001)
Opt. Commun.
, vol.200
, pp. 27-34
-
-
Naulleau, P.P.1
Anderson, E.H.2
Gullikson, E.M.3
Bokor, J.4
-
32
-
-
85010097812
-
-
Lawrence Berkeley National Laboratory, Berkeley, Calif. 94720, and P. Mirkarimiand and E. Spiller, Lawrence Livermore National Laboratory, Livermore, Calif. 94551, “Fabrication of high-efficiency multilayer-coated gratings for the EUV regime using e-beam patterned substrates (to be submitted to Appl. Opt.)
-
P. P. Naulleau, J. A. Liddle, E. H. Anderson, E. M. Gullikson, and F. Salmassi, Lawrence Berkeley National Laboratory, Berkeley, Calif. 94720, and P. Mirkarimiand and E. Spiller, Lawrence Livermore National Laboratory, Livermore, Calif. 94551, “Fabrication of high-efficiency multilayer-coated gratings for the EUV regime using e-beam patterned substrates (to be submitted to Appl. Opt.).
-
-
-
Naulleau, P.P.1
Liddle, J.A.2
Anderson, E.H.3
Gullikson, E.M.4
Salmassi, F.5
-
33
-
-
17944375589
-
Multilayer optics for an extreme-ultraviolet lithography tool with 70-nm resolution
-
E. A. Dobisc, ed. Proc. SPIE
-
R. Soufli, E. Spiller, M. A. Schmidt, C. Davidson, R. F. Grab-ner, E. M. Gullikson, B. B. Kaufmann, S. Mrowka, S. L. Baker, H. N. Chapman, R. M. Hudyma, J. S. Taylor, C. C. Walton, C. Montcalm, and J. A. Folta, “Multilayer optics for an extreme-ultraviolet lithography tool with 70-nm resolution,” in Emerging Lithographic Technologies V, E. A. Dobisc, ed. Proc. SPIE 4343, 51-59 (2001).
-
(2001)
Emerging Lithographic Technologies V
, vol.4343
, pp. 51-59
-
-
Soufli, R.1
Spiller, E.2
Schmidt, M.A.3
Davidson, C.4
Grab-Ner, R.F.5
Gullikson, E.M.6
Kaufmann, B.B.7
Mrowka, S.8
Baker, S.L.9
Chapman, H.N.10
Hudyma, R.M.11
Taylor, J.S.12
Walton, C.C.13
Montcalm, C.14
Folta, J.A.15
-
34
-
-
85010106328
-
-
1855 South 57th Court, Boulder, Colo. 80501
-
Research Electro-Optics, 1855 South 57th Court, Boulder, Colo. 80501.
-
-
-
|