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Volumn 283, Issue 1-3, 2000, Pages 84-91

Nonspecular scattering from extreme ultraviolet multilayer coatings

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CONTINUUM MECHANICS; DEPOSITION; FILM GROWTH; INTERFACES (MATERIALS); MATHEMATICAL MODELS; OPTICAL MULTILAYERS; PHOTOLITHOGRAPHY; SUBSTRATES; SURFACE ROUGHNESS; ULTRAVIOLET RADIATION;

EID: 0033750571     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01897-9     Document Type: Article
Times cited : (29)

References (31)
  • 18
    • 0003314824 scopus 로고    scopus 로고
    • High-resolution X-ray scattering from thin films and multilayers
    • New York, Springer, Berlin
    • V. Holy, U. Pietsch, T. Baumbach, High-resolution X-ray scattering from thin films and multilayers, in: Springer Tracts in Modern Physics, Vol. 149, New York, Springer, Berlin, 1999.
    • (1999) In: Springer Tracts in Modern Physics , vol.149
    • Holy, V.1    Pietsch, U.2    Baumbach, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.