Driver modeling and alignment for worst-case delay noise

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 11, Issue 2, 2003, Pages 157-166

  Blaauw, David ^a   Sirichotiyakul, Supamas ^b   Oh, Chanhee ^c  

^a UNIVERSITY OF MICHIGAN   (United States)

^b SUN MICROSYSTEMS   (United States)

^c MOTOROLA INC   (United States)

Author keywords

Cross coupled noise analysis; Delay computation; Delay noise; Signal integrity; Timing verification

Indexed keywords

ALGORITHMS; CAPACITANCE; COMPUTER SIMULATION; MICROPROCESSOR CHIPS; SIGNAL NOISE MEASUREMENT;

DELAY NOISE;

SPURIOUS SIGNAL NOISE;

EID: 0041767397     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2002.808448     Document Type: Article

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