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Volumn 12, Issue 8, 2003, Pages 1315-1321

Optical and surface analysis of DC-reactive sputtered AlN films

Author keywords

Aluminium nitride; Ellipsometry; Film; Oxidation; Sputtering

Indexed keywords

ALUMINUM NITRIDE; ATOMIC FORCE MICROSCOPY; COMPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MAGNETRON SPUTTERING; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0041621825     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(03)00076-1     Document Type: Article
Times cited : (78)

References (39)
  • 18
    • 0004077682 scopus 로고    scopus 로고
    • Technical Report IPP 9/113, Max Plank Institut fur Plasmaphysik, Garching, Germany
    • M. Mayer, SIMNRA User's Guide. Technical Report IPP 9/113, Max Plank Institut fur Plasmaphysik, Garching, Germany
    • SIMNRA User's Guide
    • Mayer, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.