메뉴 건너뛰기




Volumn 43, Issue 10, 1996, Pages 1633-1636

Wide bandgap semiconductor materials and devices

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRON TRANSPORT PROPERTIES; PHOTOEMISSION; SEMICONDUCTOR DEVICES;

EID: 0030270947     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.536807     Document Type: Article
Times cited : (232)

References (16)
  • 1
    • 0024749835 scopus 로고    scopus 로고
    • Power semiconductor device figute-of-merit for high frequency applications
    • vol. 10, p. 455, 1989.
    • B. J. BaligaPower semiconductor device figute-of-merit for high frequency applicationsIEEE Electron Device Lett., vol. 10, p. 455, 1989.
    • IEEE Electron Device Lett.
    • Baliga, B.J.1
  • 2
    • 0000843292 scopus 로고    scopus 로고
    • Physical limitations on frequency and power parameters of transistors
    • vol. 26, p. 163, 1965.
    • E. O. JohnsonPhysical limitations on frequency and power parameters of transistorsRCA Rev., vol. 26, p. 163, 1965.
    • RCA Rev.
    • Johnson, E.O.1
  • 3
    • 84948596780 scopus 로고    scopus 로고
    • Figure of merit for semiconductors for high-speed switches
    • vol. 60, p. 225, 1972.
    • R. W. KeyesFigure of merit for semiconductors for high-speed switchesFroc. IEEE, vol. 60, p. 225, 1972.
    • Froc. IEEE
    • Keyes, R.W.1
  • 4
    • 0028485013 scopus 로고    scopus 로고
    • Wide bandgap compound semiconductors for superior high-voltage unipolar power devices
    • vol. 41, pp. 1481-1483,Aug. 1994.
    • T. P. Chow and R. TyagiWide bandgap compound semiconductors for superior high-voltage unipolar power devicesIEEE Trans. ElectronDevices, vol. 41, pp. 1481-1483,Aug. 1994.
    • IEEE Trans. ElectronDevices
    • Chow, T.P.1    Tyagi, R.2
  • 5
    • 0028732473 scopus 로고    scopus 로고
    • Conductivity anisotropy in epitaxial 6H and 4H SiCin
    • G. H. Negley, K. G. Irvine, and J. W. Palmour 1994, vol. 339, pp. 595-600.
    • W. J. Schaffer, G. H. Negley, K. G. Irvine, and J. W. PalmourConductivity anisotropy in epitaxial 6H and 4H SiCin Proc. Mat. Res. Soc. Symp., 1994, vol. 339, pp. 595-600.
    • Proc. Mat. Res. Soc. Symp.
    • Schaffer, W.J.1
  • 6
    • 33747153436 scopus 로고    scopus 로고
    • Silicon carbide buried-channel chaige coupled devices
    • Charlottesville, VA, June. 19-21, 1995, Paper IVB-8.
    • S. T. Sheppard, J. A. Cooper, Jr., and M. R. MellochSilicon carbide buried-channel chaige coupled devices53rd Anna. Device Research CoJ., Charlottesville, VA, June. 19-21, 1995, Paper IVB-8.
    • 53rd Anna. Device Research CoJ.
    • Sheppard, S.T.1    Cooper Jr., J.A.2    Melloch, M.R.3
  • 7
    • 33747169413 scopus 로고    scopus 로고
    • Molecular beam epitaxy and chemical vapor deposition growth of III-V nitrides
    • St. Louis, MO, Oct. 1994.
    • R. F. DavisMolecular beam epitaxy and chemical vapor deposition growth of III-V nitrides2nd Workshop on Nitride Semiconductors, St. Louis, MO, Oct. 1994.
    • 2nd Workshop on Nitride Semiconductors
    • Davis, R.F.1
  • 8
    • 0030105508 scopus 로고    scopus 로고
    • Low resistivity aluminum nitride: Carbon (AIN:C) films grown by metal organic chemical vapor deposition
    • N. Chen. D. P. Zhang, X. Tang, and M. G. Spencer vol. 26, pp. 223-226, 1996.
    • K. Wongehotigul, N. Chen. D. P. Zhang, X. Tang, and M. G. SpencerLow resistivity aluminum nitride: carbon (AIN:C) films grown by metal organic chemical vapor depositionMater. Lett., vol. 26, pp. 223-226, 1996.
    • Mater. Lett.
    • Wongehotigul, K.1
  • 9
    • 33747171238 scopus 로고    scopus 로고
    • Structural study of degraded ZnMgSSc blue light emitters
    • S. Tomiya, M. Ukita, H. Yoshida, S. Itoh, E. Morita, M. Ikcda. and A. Ishibashi. 1995 Electron. Mat. Conf., Charlottesville, VA, June 21-23, 1995
    • K. Nakano, S. Tomiya, M. Ukita, H. Yoshida, S. Itoh, E. Morita, M. Ikcda. and A. Ishibashi. "Structural study of degraded ZnMgSSc blue light emitterspresented at the 1995 Electron. Mat. Conf., Charlottesville, VA, June 21-23, 1995
    • Presented at the
    • Nakano, K.1
  • 10
    • 33747152021 scopus 로고    scopus 로고
    • Defects and degradation in II-VI blue-green lasers and LHD's
    • G. M. Haugen, K. K. Law, B. J. Wu, M. A. Haase, and G. D. U'ren Charlottesville, VA, June 21-23, 1995.
    • S. Guha, G. M. Haugen, K. K. Law, B. J. Wu, M. A. Haase, and G. D. U'renDefects and degradation in II-VI blue-green lasers and LHD'spresented at the 7995 Electron. Mat. Conf., Charlottesville, VA, June 21-23, 1995.
    • 7995 Electron. Mat. Conf.
    • Guha, S.1
  • 11
    • 33747154229 scopus 로고    scopus 로고
    • Il-VI blue/green laser diodes on ZnSe substrates
    • C. Boney, W. H. Rowland, Jr., W.C. Hughes, J. W. Cook, Jr., J. F. Schetzina, G. Cantwell, and W. C. Harsh Charlottesville, VA, June 19-21, 1995, Paper IIB-8.
    • Z. Yu, C. Boney, W. H. Rowland, Jr., W.C. Hughes, J. W. Cook, Jr., J. F. Schetzina, G. Cantwell, and W. C. HarshIl-VI blue/green laser diodes on ZnSe substratespresented at the 53rd Annu. Device Research Conf., Charlottesville, VA, June 19-21, 1995, Paper IIB-8.
    • 53rd Annu. Device Research Conf.
    • Yu, Z.1
  • 12
    • 0028743086 scopus 로고    scopus 로고
    • Electronic structure of diamond, silicon carbide, and the group-Ill nitrides
    • 1994, vol. 339, p. 565.
    • W. R. L. LambrechtElectronic structure of diamond, silicon carbide, and the group-Ill nitridesMat. Res. Soc. Symp. Proc., Pittsburgh, PA, 1994, vol. 339, p. 565.
    • Mat. Res. Soc. Symp. Proc., Pittsburgh, PA
    • Lambrecht, W.R.L.1
  • 14
    • 0021199414 scopus 로고    scopus 로고
    • Monte-Carlo approach of electron emission from SiO2
    • vol. 81, p. 323, 1984.
    • H.-J. Fitting, J. Boyde, and J. ReinhardtMonte-Carlo approach of electron emission from SiO2PhysStat. SolidiA, vol. 81, p. 323, 1984.
    • PhysStat. SolidiA
    • Fitting, H.-J.1    Boyde, J.2    Reinhardt, J.3
  • 15


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.