Leakage control for deep-submicron circuits

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5117, Issue , 2003, Pages 135-146

  Roy, Kaushik ^a   Mahmoodi Meimand, Hamid ^a   Mukhopadhyay, Saibal ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT CONTROL; LEAKAGE CURRENTS; SEMICONDUCTOR DEVICE STRUCTURES; THICKNESS CONTROL; THRESHOLD VOLTAGE; VOLTAGE CONTROL;

DEEP-SUBMICRON CIRCUITS; LEAKAGE CONTROL;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0041327731     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.498181     Document Type: Conference Paper

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