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Volumn 74, Issue 3 I, 2003, Pages 1267-1273

Combined molecular beam epitaxy and diffractometer system for in situ x-ray studies of crystal growth

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTOMETERS; FLUORESCENCE; HIGH ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; ULTRAHIGH VACUUM; X RAY DIFFRACTION; X RAY SCATTERING;

EID: 0037351895     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1535237     Document Type: Article
Times cited : (78)

References (48)
  • 37
    • 0012735539 scopus 로고    scopus 로고
    • note
    • The beamline was manufactured by Oxford Danfysik, UK, using mirrors made by SESO. France. The MBE unit was made by CreaTec, Germany, incorporating a custom-built diffractometer manufactured by Huber, Germany.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.