X-ray scattering study of the surface morphology of Au(111) during Ar+ ion irradiation

Physical Review Letters

Volumn 80, Issue 21, 1998, Pages 4713-4716

  Murty, M V Ramana ^a   Curcic, T ^a   Judy, A ^a   Cooper, B H ^a   Woll, A R ^b   Brock, J D ^b   Kycia, S ^c   Headrick, R L ^c  

^a Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

^b Cornell University   (United States)

^c Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DIFFUSION; GOLD; ION BEAMS; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SPUTTERING; SURFACE ROUGHNESS; SURFACES; X RAY DIFFRACTION;

ION IRRADIATION; SPUTTER EROSION; SURFACE DEFECT; X RAY SCATTERING;

ELECTROMAGNETIC WAVE SCATTERING;

EID: 0032070665     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.4713     Document Type: Article

References (35)

1. E. Chason et al., Phys. Rev. Lett., 72, 3040 (1994).
2. T. M. Mayer et al., J. Appl. Phys., 76, 1633 (1994).
3. S. Rusponi et al., Phys. Rev. Lett., 78, 2795 (1997).
4. M. Ritter et al., Surf. Sci., 348, 243 (1996);
5. H.-J. Ernst, Surf. Sci., 383, L755 (1997).
6. T. Michely and G. Comsa, Nucl. Instrum. Methods Phys. Res., Sect. B, 82, 207 (1993).
7. S. J. Chey et al., Phys. Rev. B, 52, 16 696 (1995).
8. E. A. Eklund et al., Phys. Rev. Lett., 67, 1759 (1991).
9. M. Siegert and M. Plishcke, Phys. Rev. Lett., 73, 1517 (1994).
10. A. R. Sandy et al., Phys. Rev. B, 43, 4667 (1991);
11. J. V. Barth et al., Phys. Rev. B, 42, 9307 (1990).
12. R. L. Headrick et al., Phys. Rev. B, 54, 14 686 (1996).
13. P. Bedrossian (private communication).
14. B. Poelsema et al., Phys. Rev. Lett., 53, 2500 (1984).
15. P. Bedrossian et al., Phys. Rev. Lett., 67, 124 (1991);
16. P. Bedrossian and T. Klitsner, Phys. Rev. B, 44, 13 783 (1991).
17. T. Michely et al., Surf. Sci., 230, L135 (1990).
18. K. P. Reimann et al., Mater. Res. Soc. Symp. Proc., 439, 321 (1997).
19. P. Hanh et al., J. Appl. Phys., 51, 2079 (1980).
20. M. V. R. Murty et al., (to be published).
21. S. K. Sinha et al., Phys. Rev. B, 38, 2297 (1988).
22. J. A. Stroscio et al., Phys. Rev. Lett., 75, 4246 (1995).
23. J. Villain, J. Phys. I (France), 1, 19 (1991).
24. M. D. Johnson et al., Phys. Rev. Lett., 72, 116 (1994).
25. W. C. Elliot et al., Phys. Rev. B, 54, 17 938 (1996);
26. F. Tsui et al., Phys. Rev. Lett., 76, 3164 (1996);
27. L. C. Jorritsma et al., Phys. Rev. Lett., 78, 911 (1997).
28. J. G. Amar and F. Family, Phys. Rev. Lett., 77, 4584 (1996);
29. S. C. Wang and G. Ehrlich, Phys. Rev. Lett., 70, 41 (1993).
30. J.-K. Zuo and J. F. Wendelken, Phys. Rev. Lett., 78, 2791 (1997).
31. T. Curcic et al., (unpublished).
32. J. W. Evans et al., Phys. Rev. B, 41, 5410 (1990).
33. J. G. Amar and F. Family, Phys. Rev. B, 54, 14 742 (1996).
34. M. C. Bartelt and J. W. Evans, Phys. Rev. Lett., 75, 4250 (1995).
35. J. Tersoff, A. W. D. van der Gon, and R. M. Tromp, Phys. Rev. Lett., 72, 266 (1994).