On the instrumental resolution in X-ray reflectivity experiments

Journal of Applied Crystallography

Volumn 33, Issue 1, 2000, Pages 130-136

  Sentenac, D ^a   Shalaginov, A N ^a   Fera, A ^a   De Jeu, W H ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DISPERSION; ELASTICITY; GEOMETRY; MATHEMATICAL ANALYSIS; RADIATION SCATTERING; SURFACE TENSION;

EID: 0034483391     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899014272     Document Type: Article

References (9)

1. Bernhoeft, N., Hiess, A., Langridge, S., Stunault, A., Wermeille, D., Vettier, C., Lander, G. H., Huth, M., Jourdan, M. & Adrian, H. (1998). Phys. Rev. Lett. 81, 3419-3422.
2. Born, M. & Wolf, E. (1980). Principles of Optics. London: Pergamon.
3. Daillant, J., Quinn, K., Gourier, C. & Rieutord, F. (1996). J. Chem. Soc. Faraday Trans. 92, 505-513.
4. Fradin, C., Braslau, A., Luzet, D., Alba, M., Gourier, C., Daillant, J., Grübel, G., Vignaud, G., Legrand, J. F., Lal, J., Petit, J. M. & Rieutord, F. (1998). Physica B, 248, 310-315.
5. Gennes, P. G. de & Prost, J. (1993). Physics of Liquid Crystals. Oxford: Clarendon.
6. Sinha, S. K., Tolan, M. & Gibaud, A. (1998). Phys. Rev. B, 57, 2740-2758.
7. Tolan, M. (1999). X-ray Scattering from Soft-Matter Thin Films, Material Science and Basic Research. Berlin: Springer.
8. Vertogen, G. & & de Jeu, W. H. (1988). Thermotropic Liquid Crystals, Fundamentals. Berlin: Springer.
9. Vlieg, E. (1997). J. Appl. Cryst. 30, 532-543.