Effect of incident probe on HAADF STEM images

Physica Status Solidi (B) Basic Research

Volumn 235, Issue 1, 2003, Pages 179-188

  Watanabe, K ^a   Nakanishi, N ^b   Yamazaki, T ^b   Kawasaki, M ^c   Hashimoto, I ^b   Shiojiri, M ^d,e  

^a TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

^c JEOL USA INC   (United States)

^d KANAZAWA MEDICAL UNIVERSITY   (Japan)

^e KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037280342     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200301354     Document Type: Conference Paper

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