Artificial bright spots in atomic-resolution high-angle annular dark field STEM images

Journal of Electron Microscopy

Volumn 50, Issue 6, 2001, Pages 517-521

  Yamazaki, Takashi ^a   Kawasaki, Masahiro ^b   Watanabe, Kazuto ^c   Hashimoto, Iwao ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b JEOL USA INC   (United States)

^c TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

Author keywords

Artificial bright spot; Bethe method; HAADF STEM; Si; SrTiO3

Indexed keywords

CONFERENCE PAPER;

ATOMS; SILICON; STRONTIUM TITANATES; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

ARTIFICIAL BRIGHT SPOT; ATOMIC COLUMNS; ATOMIC-RESOLUTION; BETHE METHOD; BRIGHT SPOTS; ELECTRON MICROSCOPE IMAGES; HIGH-ANGLE ANNULAR DARK FIELDS; HIGH-ANGLE-ANNULAR-DARK-FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPES; SI; STEM IMAGES;

PROBES;

EID: 0035726055     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/50.6.517     Document Type: Conference Paper

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